Patents
Literature
Patsnap Eureka AI that helps you search prior art, draft patents, and assess FTO risks, powered by patent and scientific literature data.

7 results about "Beam crossing" patented technology

A beam crossing in a particle collider occurs when two packets of particles, going in opposite directions, reach the same point in space. Most of the particles in each packet cross each other, but a few may collide, producing other particles that may be observed in a particle detector. In a linear collider there is only one location where beam crossings occur, while in a modern accelerator ring there are a few locations (LHC, for example, has four); it is at these points that detectors are placed.

Laser assembly with radially combined beams

A laser assembly (12) of a system (10) includes a first emitter assembly (30a), a second emitter assembly (30b), and a combiner lens (34). The first emitter assembly (30a) generates a first emitter beam (22a) that is directed along a first emitter axis (32a) at a beam intersection area (31). The second emitter assembly (30b) generates a second emitter beam (22b) that is directed along a second emitter axis (32b) at the beam intersection area (31). The combiner lens (34) receives and spatially combines the first emitter beam (22a) and the second emitter beam (22b) after the emitter beams (22a) (22b) have intersected at and passed through the beam intersection area (31). The laser assembly (12) includes a laser frame (18); an emitter array (20) that generates a plurality of emitter beams (22); a combiner lens assembly (24) that transforms and combines the plurality of emitter beams (22) into the assembly output beam (14); and a system controller (26) that controls the operation of the laser assembly (12). The combiner lens assembly (24) including combiner lenses (34, 36, 38) has a fast axis, front side focal point (24a), and a fast axis and slow axis, rear side focal point (24b). It is positioned so that its fast axis front side focal point (24a) is approximately at the beam intersection area (31). The optical fiber (16) is positioned so that its inlet facet (16A) is approximately at the fast axis and slow axis, rear side focal point (24b).
Owner:DAYLIGHT SOLUTIONS INC

Method of operating charged particle microscope system including beam deflector and associated system

The disclosure relates to a method of operating a charged particle microscope system including a beam deflector and an associated system. In one example, a method includes adjusting one or more optical elements such that a deflector plane of a beam deflector is conjugated to a diffraction plane, and recording a diffracted beam pattern at the diffraction plane. In another example, a method includes directing a charged particle beam to a sample, transitioning a beam blanker between a blanked state and an unblanked state, and recording a beam pattern by a detector. The beam pattern includes one or more beam pattern features that are substantially stationary in the detector plane when the beam blanker transitions between an unblanked state and a blanked state. In another example, a CPM system includes a charged particle source, a beam deflector at a deflector plane, and a detector. The CPM system is configured such that the charged particle beam exhibits a beam intersection at the deflector plane, and such that the deflector plane is imaged onto the detector.
Owner:FEI CO

Method and Device for Laser Ray Tracing Measurement of Intraocular Distances and Structures

PendingUS20260194343A1Beam splitterAcousto optic deflector
Provided herein are a method and device for laser ray tracing measurement of intraocular distances and structures. Generally, the device has a laser, pairs of acousto-optical deflectors, drivers, frequency generators, and beam splitters, a telescope and collimating lens, a basic optometric channel and a processing unit arranged and configured to probe an eye with modulated laser beams oriented to cross along optically determinable paths. Analysis of the detectable backscattered radiation is used to confirm the position of a beam cross-point and to calculate the distance thereof to an apex of the cornea. Data obtained from repeated probing is used to reconstruct the intraocular structure of the eye.
Owner:TRACEY TECH LLC

Methods of operating a charged particle microscope system including a beam deflector and associated systems

In an example, a method includes adjusting one or more optical elements such that a deflector plane of a beam deflector is conjugate to a diffraction plane and recording a diffracted beam pattern at the diffraction plane. In another example, a method includes directing a charged particle beam to a specimen. transitioning a beam blanker between blanked and unblanked states, and recording a beam pattern with a detector. The beam pattern includes one or more beam pattern features that are substantially stationary in a detector plane as the beam blanker transitions between the unblanked and blanked state. In another example, a CPM system includes a charged particle source, a beam deflector at a deflector plane, and a detector. The CPM system is configured such that a charged particle beam exhibits a beam crossover at the deflector plane and such that the deflector plane is imaged onto the detector.
Owner:FEI CO

A circuit breaker and a stationary end structure thereof

The application relates to a circuit breaker and a static terminal structure thereof, the static terminal structure of the circuit breaker comprising a static main contact, a static arc contact and a static support, the static main contact being provided with a front barrel opening and a rear barrel opening at the front end and the rear end respectively, the rear barrel opening facing the static support, the rear end of the static main contact being provided with an intermediate beam crossing the rear barrel opening, the intermediate beam being provided with a through hole for the static arc contact, the intermediate beam and the inner wall of the barrel of the static main contact surrounding an airflow through hole, the intermediate beam being a straight line structure, the airflow through hole being an arc-shaped hole, the airflow through hole being two and being symmetrically arranged on the left and right sides of the intermediate beam, the airflow through hole being used for the hot airflow generated by the breaking point of the circuit breaker to flow from the inner cavity of the static main contact into the inner cavity of the static support; the intermediate beam is used as a carrier for supporting the static arc contact, the two sides of the intermediate beam can surround the inner wall at the rear barrel opening of the static main contact to form an airflow through hole with a large opening area, the through-flow area is increased, and the smoothness of the static side airflow exhaust passage is improved.
Owner:HENAN PINGGAO ELECTRIC +1

Method and device for measuring intraocular distance and structure through laser ray tracing

A method and apparatus for laser ray tracing measurements of intraocular distances and structures are provided herein. Generally, the device has a laser, a pair of acousto-optic deflectors, a driver, a frequency generator and beam splitter, a telescope and collimating lens, a base optometric channel and a processing unit, and is arranged and configured to detect the eye with a modulated laser beam oriented to intersect along an optically determinable path. Analysis of detectable backscattered radiation is used to confirm the position of the beam intersection and to calculate its distance to the corneal vertex. The data obtained by repeated probing is used to reconstruct the intraocular structure of the eye.
Owner:TRACEY TECH LLC

A method and system for evaluating the precision of spaceborne SAR uncontrolled positioning, an electronic device and a storage medium

PendingCN122110021AWave based measurement systemsGeometric modelingBeam crossing
The application discloses a kind of evaluation methods, systems, electronic equipment and storage medium of spaceborne SAR uncontrolled positioning accuracy, it is related to microwave remote sensing SAR satellite technical field, alleviateed the problem that existing spaceborne SAR uncontrolled positioning accuracy evaluation technology cannot be accurately evaluated and decomposed inaccuracy.A kind of evaluation method, the position and speed of the satellite to be evaluated at initial time and the imaging position of target point are obtained;The position and speed of the satellite to be evaluated at beam crossing time are obtained, the slant range between the satellite to be evaluated and target point and doppler center frequency;The predicted imaging position of the target point is obtained by SAR geometric model;Based on imaging position and predicted imaging position, obtain a plurality of error proportion factors;Further, the total positioning error is obtained as the evaluation of spaceborne SAR uncontrolled positioning accuracy.The application is suitable for the field of spaceborne SAR overall design.
Owner:CHANGGUANG SATELLITE TECH CO LTD