Patents
Literature
Hiro is an intelligent assistant for R&D personnel, combined with Patent DNA, to facilitate innovative research.
Hiro

89 results about "Diode detectors" patented technology

Method for accurately measuring narrow pulse modulation parameter

The invention relates to a method for accurately measuring a narrow pulse modulation parameter. According to the method, a narrow pulse modulation signal RF passes through a double-diode detector, a logarithmic amplifier and a channel operational amplifier unit in sequence and is divided into two paths of signals, one path of signal is fed into a high-speed analog-to-digital converter (ADC) module for analog-to-digital (A/D) conversion by a bandwidth control unit, the other path of signal is fed into a high-speed trigger circuit, the high-speed ADC module triggers A/D conversion according to a pulse signal generated by the high-speed trigger circuit, and effective ADC data is acquired, fed into a field programmable gate array (FPGA) and stored in the FPGA according to a trigger signal generated by the high-speed trigger circuit; and a digital signal processor (DSP) unit reads the effective ADC data from the FPGA, processes the data and stores an operation result in a high capacity random access memory (RAM). By the method for accurately measuring the narrow pulse modulation parameter, the narrow pulse modulation parameter with the minimal pulse width of 30ns and the dynamic range of -27 to +20dBm can be measured, and both the time parameter and the amplitude parameter of the narrow pulse modulation signal can be measured.
Owner:CHINA ELECTRONIS TECH INSTR CO LTD

Manufacturing method of flat-type avalanche diode detector used for detecting single photon

The invention relates to a manufacturing method of a flat-type avalanche diode detector used for detecting a single photon. The manufacturing method comprises the following steps: sequentially growing an InP buffer layer, an InGaAs absorbing layer, an InGaAsP gradient layer, an N-type InP charge layer and an InP cap layer on an N-type InP substrate; growing an SiO2 protective layer on the InP caplayer; photoengraving a round window at the middle of the SiO2 protective layer; eroding the InP cap layer in the round window through wet-method erosion, thereby forming a round hole; carving a protection ring window on the SiO2 protective layer around the round window; removing surplus SiO2 protective layer by utilizing an HF (hydrogen fluoride) solution in the protection ring window through a diffusion process; regrowing the InP cap layer an SiO2 layer, and caving an electrode window at the periphery of the round hole; forming a top ring electrode on the electrode window through an electron beam evaporation and desquamation process, and preparing a metal electrode at the periphery and one side of the ring electrode; and forming a back electrode at the back of the N-type InP substrate through electron beam evaporation, and preparing a SiNx antireflection layer at the surface of the InP cap layer in the round hole, thereby finishing the manufacture of the avalanche diode detector.
Owner:INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI

Contaminant Detector For Food Inspection

A contaminant detection machine (1) including a conveyor (3) which causes an object under inspection (79) to pass through a plane (48) of emitted x-ray radiation. The plane is generated by an x-ray tube (55) that emits a lateral beam, thereby permitting the distance (88) between the x-ray tube and the object under inspection to be reduced. A photo diode arch mounting assembly (104) is placed above the object under inspection and is mated to a collimator assembly (125) that also serves as the mounting bracket for the x-ray generation assembly (38), thereby preserving optical alignment between the photo diode detector array (28) and the emitted x-ray plane (48). The detector array (28) scans the object under inspection (79) so as to produce a continuous series of discrete lines, each line being analyzed by an image processing unit (116) to determine the presence or absence of a contaminant. The conveyor (3) passes over a pair of slider bed surfaces (155, 156) which are mounted in a hinged manner such that the leading edge (168) of one surface (156) is parallel to and spaced apart from the trailing edge (172) of the other surface (155), thereby creating a gap that is coplanar with the collimation slot (129) and the emitted x-ray plane (48). Each bed surface (155, 156) is rigidly constrained within open ended mounting brackets (159, 160, 161 and 162) yet can be removed by hand without the use of tools. Similarly, the conveyor (3) is supported by a roller assembly (182) that includes a tracking block (142) and pivot pin (143) which permits the roller assembly to be mounted to and removed from flip up mounts (151, 152) by hand and without the need of tools. Graphical user interfaces (249, 260, 261, 266, 275, 282 and 288) permit a user to operate the machine (1) by means of a liquid crystal display touch screen (20).
Owner:THERMO FISHER SCIENTIFIC INC

Internal calibration circuit of microwave power probe and calibration method

The invention provides an internal calibration circuit of a microwave power probe. The internal calibration circuit of the microwave power probe includes a microwave power sensor, a multi-core cable and a host power measurement channel; after microwave signals are inputted, a diode detector pair enabling +detection and -detection performs detection, so that +detection voltage and -detection voltage which are opposite to each other and have the same amplitude are outputted; a precise input operational amplifier performs 1:1 reverse amplification on output voltage of a D/A converter; various kinds of compensation data of the probe are stored in an EEPROM; an interface extender controls port output states through an IIC bus and is used for controlling the switching selection of high-speed switches and operating control signals of the D/A converter; and a linear differential amplifier enhances the transmission capability of the signals and transmits the signals to a power meter host through a cable. Compared with a method in which a calibration source plate is arranged inside a host, with the circuit and method of the invention adopted, 2000 yuan to 3000 yuan is expected to be saved, and calibration time is short, and calibration can be completed in one minute.
Owner:CHINA ELECTRONIS TECH INSTR CO LTD

System and method for testing power stability of highly stable radiofrequency signal

ActiveCN105929222ARealize proportional conversion outputReduced by temperature changes, etc.Transmitters monitoringElectric devicesTest powerMicrowave power meter
The invention discloses a system and method for testing power stability of a highly stable radiofrequency signal. The system includes a directional coupler, an attenuator set, a microwave power meter, an upper computer, a high precision digital universal meter and a diode detector. The directional coupler is successively in serial connection to the attenuator set and the microwave power. The upper computer conducts system application measurement and control respectively on the microwave power meter and the high precision digital universal meter. A coupling end of the directional coupler is connected to the diode detector. The diode detector is in connection to the high precision digital universal meter and is a gallium arsenide diode detector. According to the invention, the system and the method have the following benefits: through the testing of stability of demodulation voltage, the evaluation object in testing the power stability of the radiofrequency signal is synchronously acquired in a non-distortion manner, and a constant temperature chamber and a gallium arsenide device are configured to reduce the influence on the demodulation voltage by temperature changes to the minimum with the proviso that the power of the input radiofrequency signal stays unchanged.
Owner:THE 41ST INST OF CHINA ELECTRONICS TECH GRP

Magneto-optic circular polarization dichroism measuring system capable of adjusting measuring geometry

A measuring system for measuring the dichroism of the magneto-optical circular polarization with adjustable measuring geometry is provided, whose structure is that: a femtosecond laser excites the white light of the ultra-continuous spectrum, and divides the light by a monochrometer, which forms a monochromatic light whose wavelength can be adjustable. The monochromatic light can polarize through a purified Glan-Taylor prism with the extinction coefficient of 10 <5>; a lantern fly modulator, whose optical axis is 45degree angled with the optical axis of the Glan-Taylor prism to make the light become the circularly polarized light with the alternative variation of the sinistrality and the dextrorotation; a sample, which is put on the center of the cryogenic magnet; The circularly polarized light focuses on the sample, and the reflex reflected from the sample is focuses on the first LED detector; a phase-locking amplifier, whose reference signal is provided by the lantern fly modulator used for testing the difference of light intensity between the sinistrality and the dextrorotation of the circularly polarized light. The invention can not only test the frequency spectrum of the dichroism of the magneto-optical circular polarization of the materials, magnetic density and temperature dependence, but also can test the magnetocrystalline anisotropy of the magnetic semiconductor.
Owner:INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI

Coherent phase detecting method based on Mach-Zehnder interferometer

The invention discloses a coherent phase detecting method based on a Mach-Zehnder interferometer, belonging to the technical field of optical quantity detection. Lasers emitted by a laser source (1) are divided into two paths through a first optical fiber coupler (2) and then are respectively transmitted by a first optical fiber interference arm (4) and a second optical fiber interference arm (5); the first optical fiber interference arm (4) and the second optical fiber interference arm (5) are putted into the same constant-temperature control system; two paths of lasers are combined into one path in a primary phase difference detection process, and the photocurrent intensity Io of the combined laser is detected by using a photoelectric diode detector; the intensities I1, I2 of photocurrents output from the two optical fiber interference arms are respectively detected; and the primary phase difference of the two optical fiber interference arms is calculated by using a formula. The invention has the advantages of simple operation and low cost because of no use of a phase shifter of a piezoelectric crystal and the like; a computer is not used to assist calculation, and the measurement precision is superior to 0.04 and better precision can be obtained under larger laser drive current.
Owner:JILIN UNIV

Optical topology imaging system and method on basis of digital phase locking detection technology

InactiveCN102599888ALow priceQualitative measurement imaging stability is goodDiagnostic recording/measuringSensorsData acquisitionInfrared wavelength
The invention belongs to the field of near-infrared optical tissue imaging, and relates to an optical topology imaging system on the basis of digital phase locking detection technology. The optical topology imaging system comprises a light source, a detection portion, a data acquisition portion and a computer, the light source comprises at least two laser devices capable of generating laser with different near-infrared wavelengths, a multichannel direct digital synthetic sine signal modulator, a single-mode optical fiber and wavelength division multiplexer and a light switch; and the detection portion comprises a plurality of source optical fibers, a plurality of detection optical fibers, source and detection optical fiber distribution patches, four silicon photoelectric diode detectors and a multichannel program control filter amplifier, each source and detection optical fiber distribution patch comprises five source points and four detection points, wherein the five source points of each source and detection optical fiber distribution patch are respectively distributed at the four vertexes and the center of a square, and the four detection points of each source and detection optical fiber distribution patch are distributed at the midpoints of four sides of the corresponding square. The invention also provides a tissue imaging method realized by the aid of the optical topology imaging system. The imaging system is cheap in price, stability of observational measurement imaging is fine, and the measurement area and the accuracy of the system can be improved.
Owner:TIANJIN UNIV

Contaminant detector for food inspection

A contaminant detection machine (1) including a conveyor (3) which causes an object under inspection (79) to pass through a plane (48) of emitted x-ray radiation. The plane is generated by an x-ray tube (55) that emits a lateral beam, thereby permitting the distance (88) between the x-ray tube and the object under inspection to be reduced. A photo diode arch mounting assembly (104) is placed above the object under inspection and is mated to a collimator assembly (125) that also serves as the mounting bracket for the x-ray generation assembly (38), thereby preserving optical alignment between the photo diode detector array (28) and the emitted x-ray plane (48). The detector array (28) scans the object under inspection (79) so as to produce a continuous series of discrete lines, each line being analyzed by an image processing unit (116) to determine the presence or absence of a contaminant. The conveyor (3) passes over a pair of slider bed surfaces (155, 156) which are mounted in a hinged manner such that the leading edge (168) of one surface (156) is parallel to and spaced apart from the trailing edge (172) of the other surface (155), thereby creating a gap that is coplanar with the collimation slot (129) and the emitted x-ray plane (48). Each bed surface (155, 156) is rigidly constrained within open ended mounting brackets (159, 160, 161 and 162) yet can be removed by hand without the use of tools. Similarly, the conveyor (3) is supported by a roller assembly (182) that includes a tracking block (142) and pivot pin (143) which permits the roller assembly to be mounted to and removed from flip up mounts (151, 152) by hand and without the need of tools. Graphical user interfaces (249, 260, 261, 266, 275, 282 and 288) permit a user to operate the machine (1) by means of a liquid crystal display touch screen (20).
Owner:THERMO FISHER SCIENTIFIC INC

Integrated high-sensitivity millimeter wave receiver for millimeter wave array imaging system

The invention provides an integrated high-sensitivity millimeter wave receiver for a millimeter wave array imaging system, which comprises a plate body with a hole body, an integrated RF circuit fixed on one side of the plate body, a power supply circuit fixed on the other side of the plate body, and two packaging cover bodies; the integrated RF circuit further comprises a plane micro strip slot antenna used to receive millimeter wave, a low-noise amplifier used to amplify the accessed millimeter wave, and a mixed and integrated diode detector used to convert the amplified millimeter wave into low-frequency voltage signals which are in direct proportion to the power; the power supply circuit is connected with the integrated RF circuit through the hole body, and is used to supply power to the RF circuit; and the two packaging cover bodies are used to clamp the plate body for packaging. The compact structure can effectively overcome large size, poor stability and other defects, greatly reduces the size and the weight of the millimeter wave receiver, improves the performance, the quality and the reliability of the complete machine, and is applicable to mass production, so as to meet the needs of the array millimeter wave imaging system.
Owner:杭州芯影科技有限公司

Simple optoacoustic detector for detecting high-corrosion gas

The invention relates to the field of optoacoustic detection, and provides a simple optoacoustic detector for detecting high-corrosion gas. The simple optoacoustic detector comprises an infrared laser, an infrared laser beam, an optoacoustic pool, an energy meter, a cantilever, a probe laser beam, a probe laser, a photodiode detector, a differential amplification circuit, a digital-to-analogue conversion circuit and a computer, wherein the photodiode diode detector is sequentially connected with the differential amplification circuit, the digital-to-analogue conversion circuit and the infrared laser; the cantilever is made of mica materials and is positioned in the optoacoustic pool; the distance from the photodiode detector to the surface of the cantilever is about 10cm; the infrared laser beam can enter the optoacoustic pool; the energy meter is positioned at the back side of the optoacoustic pool; the energy of each laser pulse can be measured; the optoacoustic signal can be normalized; the probe laser beam can be directly irradiated onto the surface of the cantilever and can be reflected to the photodiode detector; the signal distinguished regulation can be realized through inclining the photodiode.
Owner:JINHUA VOCATIONAL TECH COLLEGE

Absolute delay measurement method for frequency converter

The invention discloses an absolute delay measurement method for a frequency converter. The method comprises the following steps: (1) calibration measurement: generating two paths of signals through a signal generator, inputting one path of signal into a first channel of a digital signal acquiring device through a diode detector, inputting the other path of signal into a second channel of the digital signal acquiring device through a spectrum analyzer, and computing a pulse time difference T1 between the first channel and the second channel; (2) delay measurement: generating two paths of signals through the signal generator, inputting one path of signal into the first channel of the digital signal acquiring device through the diode detector, inputting the other path of signal into the second channel of the digital signal acquiring device after the signal passes through the frequency converter to be measured and the spectrum analyzer, and computing a pulse time difference T2 between the first channel and the second channel; and (3) computation of the absolute delay of the frequency converter, wherein the absolute delay value of the frequency converter is computed according to a formula deltaT=T2-T1. According to the absolute delay measurement method for the frequency converter disclosed by the invention, reference to standard comparison is not required, and the measuring accuracy is high.
Owner:SHANGHAI PRECISION METROLOGY & TEST RES INST

Multilayer bispectral photodiode detector

This bispectral detector comprises a plurality of unitary elements for detecting a first and a second electromagnetic radiation range, consisting of a stack of upper and lower semiconductor layers of a first conductivity type which are separated by an intermediate layer that forms a potential barrier between the upper and lower layers; and for each unitary detection element, two upper and lower semiconductor zones of a second conductivity type opposite to the first conductivity type, are arranged respectively so that they are in contact with the upper faces of the upper and lower layers so as to form PN junctions, the semiconductor zone being positioned, at least partially, in the bottom of an opening that passes through the upper and intermediate layers. The upper face of at least one of the upper and lower layers is entirely covered in a semiconductor layer of the second conductivity type. Cuts are made around each unitary detection element from the upper face of the stack and at least through the thickness of each semiconductor layer of the second conductivity type, entirely covering one or other of the upper and lower semiconductor layers of the first conductivity type, so as to form semiconductor zones of the second conductivity type.
Owner:COMMISSARIAT A LENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products