This invention relates to a method, apparatus,
computer device, and storage medium for inspecting circuit layouts, and pertains to the field of circuit
layout design technology. This method, by comprehensively inspecting the circuit
layout based on information from both functional items and physical points, achieves more accurate inspections and reduces wasted
layout area. Furthermore, the increased accuracy improves the effective
utilization rate of the circuit layout area, reduces unnecessary layout and wiring, saves on process and manpower optimization costs, and avoids some difficult-to-detect electrical and yield problems caused by inappropriate circuit settings.