4results about How to "Smooth waveform" patented technology

The utility model belongs to the technical field of monitoring and early warning, and particularly relates to an industrial factory building safety intelligent connection panoramic monitoring and early warning device which comprises an MCU microcontroller, an infrared temperature sensor, a signal processing module and an alarm module. The infrared temperature sensor is connected with the MCU microcontroller through the signal processing module; the microcontroller is connected with the alarm module; the signal processing module comprises a signal amplifying circuit and a signal filtering circuit; the signal amplification circuit comprises a signal amplification chip; the slide rheostat is connected between the-Rg pin and the + Rg pin of the signal amplification chip, so that the amplification factor of the signal amplification circuit can be changed by adjusting the resistance value of the slide rheostat, the detection sensitivity is improved, detection and amplification of small voltage are facilitated, and when a fire disaster is in the bud, the fire disaster can be prevented from being damaged. Therefore, the fire hazard can be predicted as early as possible.

The invention discloses a wire diameter measuring method based on optical diffraction. The wire diameter measuring method comprises the following steps: acquiring an optical diffraction image of a filament to be measured; performing analog-to-digital conversion sampling on the optical diffraction image to generate a first waveform signal; extracting an effective wave band from the first waveform signal to generate a second waveform signal; performing denoising processing on the second waveform signal to generate a third waveform signal; searching the position of each wave trough in the third waveform signal, and calculating the distance between adjacent wave troughs to obtain a plurality of wave trough distances corresponding to dark fringe distances; and determining the wire diameter of the filament according to the relationship between the trough spacing and the wire diameter of the filament. The measuring method can be used for measuring the diameter of the filament.

The present invention discloses a quantum control waveform overshoot correction method, system, storage medium and electronic device based on frequency response measurement, including: setting pulse parameters and output mode, loading pulse signal and outputting and playing, collecting output waveform and measuring system pulse response; obtaining the system's frequency response function, frequency domain compensation frequency response function and time domain waveform function through data transformation processing; using two convolution processes to obtain the final correction data; loading the correction data to correct the waveform, and cooperating with a programmable gate array for parallel calculation. The method uses two convolution processes to convert edge data into calibration data and then use the calibration data to correct the waveform, and cooperates with a programmable gate array for parallel calculation, so that the corrected waveform is smoother, avoiding the problem of missing edges or over-correction in manual calibration, and effectively improving the calculation efficiency and calibration accuracy.

The application discloses an improved digital filter processing circuit which performs data processing on AD collected data, comprising an AD data collection module, a data processing core module and a data storage module. The AD data collection module collects data after AD conversion, outputs the data to a data processing core module for processing by a de-bounce filter algorithm, and then sends the data to a data storage module for storage. The data processing core module processes data after grouping and overlapping according to a bubble sorting form based on data stored in the data storage module. The data storage module realizes temporary storage of AD collected data and storage of data after sorting processing. The application realizes the function of data processing on AD collected data.