The utility model relates to a
chip temperature test experimental platform device, which comprises a
machine body, and the
machine body is provided with a
test chamber, a pre-temperature chamber and an adjusting chamber which are separated by partition structures. The
test chamber is used for testing the temperature of the
chip; the pre-heating chamber is used for pre-cooling the
chip when the chip is subjected to a low-temperature test; the adjusting cavity communicates with the exterior of the
machine body through an exhaust fan, and the exhaust fan is an exhaust fan with the adjustable rotating speed. The testing chamber is communicated with the pre-warming chamber, the pre-warming chamber is communicated with the adjusting chamber, the testing chamber is provided with a first
cold air inlet, and the pre-warming chamber is provided with a second
cold air inlet. According to the technical scheme of the utility model, air flow can be accelerated by starting the exhaust fan, low-
dew-point dry air is continuously input into the
test chamber and the pre-heating chamber along with the first
cold air inlet and the second cold air inlet, and the
dew points in the test chamber and the pre-heating chamber can be rapidly reduced so as to reach the required
dew point; therefore, the efficiency of reducing the dew points in the test chamber and the preheating chamber can be improved.