2results about How to "Good detection rate" patented technology

This application relates to the field of flexible printed circuit board (FPCA) inspection technology, and discloses a multi-region targeted algorithm fusion detection method for FPCA. The method includes: acquiring the image to be inspected, extracting process reference points and estimating the nonlinear deformation field, and performing geometric correction on image block features; orthogonally decoupling the corrected features into semantic direction components and interference amplitude components, discarding the interference amplitude components; performing weighted similarity matching between the semantic direction components and a weighted memory stored according to preset weights of functional regions to obtain anomaly scores; fusing multi-scale anomaly scores and comparing them with a threshold to output the detection results. This application eliminates deformation and illumination interference through a dual mechanism of geometric correction and feature decoupling, and improves the detection capability of minute defects by combining a functional region weighted memory with multi-scale fusion, achieving a significant improvement in detection accuracy and robustness.

The application discloses a tandem repeat expansion detection method for third-generation sequencing sequences. The application is committed to breaking away from the constraint of a predefined catalog in the background of third-generation sequencing, especially Oxford Nanopore Technologies (ONT) sequencing data, realizing high-sensitivity de novo detection of short tandem repeat expansion, designing a consensus sequence generation algorithm of edge typing and edge correction under GPU acceleration, realizing high-precision haplotype sequence analysis, and giving consideration to algorithm efficiency and clinical-level detection accuracy.