A combined handheld XRF and LIBS
system and method includes an XRF subsystem with an X-
ray source operated at a fixed medium
voltage and configured to deliver X-rays to a sample without passing through a mechanized filter and a
detector for detecting fluoresced
radiation from the sample. The LIBS subsystem includes a low power
laser source for delivering a
laser beam to the sample and a narrow
wavelength range
spectrometer subsystem for analyzing optical emissions from the sample. The X-
ray source is operated at the fixed medium
voltage to analyze the sample for a first group of elements, namely, transition and / or
heavy metals. The low power
laser source is operated to analyze the sample for a second group of elements the XRF subsystem cannot reliably detect, namely, C, Be, Li, Na, and / or B, and to analyze the sample for a third group of elements the XRF subsystem cannot reliably detect at the fixed
voltage, namely, Al, Si, and / or Mg, or where the XRF subsystem would require higher tube voltage, namely Cd, Ag, In, Sn, Sb, and / or Ba; and / or
rare earth elements.