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57results about How to "Improve frequency performance" patented technology

Method for preparing diamond base FET device with T-similar-type grid shelter autocollimation technology

The invention discloses a method for preparing a diamond base FET device with the T-similar-type grid shelter autocollimation technology, and relates to the technical field of methods for manufacturing semiconductor devices. The method comprises the step of forming a high-resisting diamond layer on a high temperature resistance substrate, the step of forming a conducting channel in the high-resisting diamond layer, the step of covering the surface of the high-resisting diamond layer with a metal mask layer, the step of photoetching a table-board, the step of removing a metal mask outside the table-board area through corrosive liquid, the step of forming grids on the metal mask in a photoetching mode, the step of removing the metal mask in the middle of a source leaking area through the corrosive liquid and forming source leakage, the step of manufacturing the T-similar-type grids in the corrosion area, the step of oxidizing or nitriding the outer sides of metal grids and forming a dielectric layer, and the step of enabling the T-similar-type grids to serve as a shield. According to the method, the T-similar-type grid shelter autocollimation technology is adopted, the distance between a grid source position and a grid leakage position is effectively shortened and is basically equal to the grid length, and the grid source resistance and grid leak resistance are reduced.
Owner:THE 13TH RES INST OF CHINA ELECTRONICS TECH GRP CORP

Method for determining distributed explosive source triggering parameters

The invention provides a method for determining distributed explosive source triggering parameters. The method comprises the steps of (a) adopting a near-surface survey method to delimit a rock-soil layer horizon of a surface layer and determining basic physical parameters; (b) performing gun testing and triggering, and monitoring and recording ground vibration; (c) according to gun testing arrangement and rock-soil layering of the earth surface, establishing a finite element model of explosion action in rock-soil of the explosive source; (d) performing comparing regression analysis by finite element model calculation and test monitoring records, and determining rock-soil dynamic deformation model parameters; (e) performing analysis comparison on initial elastic wave energy and frequency in multiple distributed explosive source triggering schemes on the basis of the established on-site rock-soil layer model, combining exploration target layer characteristics and requirements, and determining that the distribution satisfying the energy and resolution is explosive source triggering parameters. The method for determining the distributed explosive source triggering parameters, provided by the invention, is rapid in speed, wide in application scope, low in cost, simple and convenient, and easy to implement.
Owner:BEIJING INSTITUTE OF TECHNOLOGYGY

Thin SOI longitudinal bipolar transistor and manufacturing method thereof

ActiveCN101719508AOvercoming large input resistanceOvercome the problem of large inter-electrode capacitanceSemiconductor/solid-state device manufacturingSemiconductor devicesCapacitanceEngineering
The invention provides a thin SOI longitudinal bipolar transistor and a manufacturing method thereof. In the prior art, a base lead-out region is manufactured in top silicon and is connected with a silicon base region through a base connecting region, which causes the problems of complicated process, over-high base input resistance and interelectrode capacitance, and poor frequency performance ofthe transistor. The transistor of the invention, which is manufactured in the top silicon and is positioned between a first isolation structure and a second isolation structure, comprises a collectorregion, a silicon base region and a silicon emitter region which are sequentially stacked, wherein a collector lead-out region is arranged between the first isolation structure and a third isolation structure, is connected with the collector region, and is isolated from the silicon base region and the silicon emitter region through the third isolation structure; a polycrystalline base region and a polycrystalline emitter region are arranged on the top silicon in parallel; a medium isolation structure is arranged between the polycrystalline base region and the polycrystalline; the opposite outsides of the polycrystalline base region and the polycrystalline are provided with side walls; and the polycrystalline base region and the polycrystalline are connected with the silicon base region and the silicon emitter region respectively. The thin SOI longitudinal bipolar transistor and the manufacturing method thereof can reduce process complexity, effectively reduce the base input resistanceand the interelectrode capacitance, and effectively improve the frequency performance of the transistor.
Owner:SHANGHAI HUAHONG GRACE SEMICON MFG CORP

Co-electrode thin SOI longitudinal bipolar transistor device and manufacturing method thereof

The invention provides a co-electrode thin SOI longitudinal bipolar transistor device and a manufacturing method thereof. In the prior art, the transistors does not share an electrode so as to cause incompact device structure and low integration degree, and in addition, the base leading-out area is connected with the silicon base area through the base connecting area so as to cause complex process, high base input resistance and poor frequency performance. The device of the invention comprises a plurality of transistor units provided with first and second transistors; both the first and second transistors have a collector area, a silicon base area and a silicon emitter area which are overlapped in the top silicon in turn and a polycrystalline emitter area arranged on the top silicon; a shared polycrystalline base area is connected with the silicon base areas of the first and second transistors, arranged between the polycrystalline emitter areas of the first and second transistors, and isolated with the polycrystalline emitter areas through a medium isolation structure; and a shared collector leading-out area is arranged between two adjacent transistor units, and two ends of the shared collector leading-out area are connected with the collector areas at two sides respectively. The device has the advantages of compact structure, high integration degree, low base input resistance and good frequency performance.
Owner:SHANGHAI HUAHONG GRACE SEMICON MFG CORP
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