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378 results about "Ft ir spectroscopy" patented technology

FT-IR Spectroscopy. FT-IR (Fourier Transform – Infrared) Spectroscopy is used to identify or verify the material composition of a sample. An infrared light source is directed at the sample and a measurement is taken of how much light is absorbed at different wavelengths.

Surface Raman and infrared spectroscopy double-enhanced detecting method based on graphene and nanogold compounding

Provided is a surface Raman and infrared spectroscopy double-enhanced detecting method based on graphene and nanogold compounding.According to the method, light sources, a lens, a graphene nanobelt and gold nanoparticle composite substrate, an infrared Fourier spectrograph and a Raman spectrometer are included.Infrared light waves and visible light waves emitted by the infrared light source and the laser light source respectively pass through a beam combiner and then irradiate the graphene nanobelt and gold nanoparticle composite substrate, after the light waves and trace molecules adsorbed on the substrate interact, reflected light is gathered by the focusing lens to enter the infrared Fourier spectrograph, and meanwhile scattered light is gathered into the Raman spectrometer.Raman scattering signals of the trace molecules can be enhanced through the local area plasma effect of the gold nanoparticles, and meanwhile infrared absorption spectrum signals of the trace molecules can be dynamically enhanced through the graphene surface plasma effect within the broadband range.According to the method, double enhancement of surface Raman and broadband infrared spectroscopy signals is achieved on the same substrate, and the advantages of being wide in enhancement wave band, high in detecting sensitivity, wide in detected matter variety range, good in stability and the like are achieved.
Owner:CHONGQING UNIV

High resolution micro infrared spectrometer based on MEMS scanning micromirror

The invention discloses a high resolution micro infrared spectrometer based on an MEMS scanning micromirror. The high resolution micro infrared spectrometer comprises a fiber connecting device, an incident slit, a collimation reflector, a scanning micromirror, a blazed grating, a spherical surface focusing reflectors, an emitting slit and a high sensitivity unit infrared detector. A novel optical path structure is employed by the high resolution micro infrared spectrometer: an external optical signal to be measured is coupled into a spectrometer through the fiber and the slit and collimated by the spherical surface collimation reflector; the MEMS scanning micromirror and a diffraction grating are utilized to substitute a scanning raster in a traditional scanning raster spectrometer to realize optical splitting and spectrum scanning functions together; during torsional pendulum of the micromirror surface, a combination of two spherical surface reflectors carries out focusing and imaging on the spectrum, so that light with different wavelengths is focused and imaged and irradiates on the detector through the emitting slit successively to realize continuous detection of spectrum. The spectrometer based on the MEMS scanning micromirror provided by the invention has advantages of small volume, wide spectrum measurement scope, high resolution and low cost, etc.
Owner:CHONGQING UNIV

Method for discriminating fermentation quality of congou black tea based on near-infrared-spectroscopy-combined amino acid analysis technology

The invention discloses a method for discriminating fermentation quality of congou black tea based on a near-infrared-spectroscopy-combined amino acid analysis technology. The method comprises: selecting a sample and performing pre-processing; using high performance liquid chromatograph to determine the content of amino acids in the sample; acquiring the spectrum of the sample, utilizing synergy interval partial least square to establish a near-infrared-spectroscopy quantitative discrimination model for amino acids, finding amino acid variation distribution, and discriminating the fermentation quality of congou black tea. According to the method for discriminating the fermentation quality of congou black tea based on the near-infrared-spectroscopy-combined amino acid analysis technology, pretreatment is performed on an acquired original spectrum by utilizing standard normal variable transformation (SNVT), and the amino acid near-infrared discrimination model is constructed by employing synergy interval partial least square (SiPLS). The invention provides the quantitative determining method for scientifically accurately discriminating the fermentation quality congou black tea.
Owner:ANHUI AGRICULTURAL UNIVERSITY

Single pass attenuated total reflection fourier transform infrared microscopy apparatus and method for identifying protein secondary structure, surface charge and binding affinity

Apparatus and method for acquiring an infrared spectrum of a sample having or suspected to have an amide I band, an amide II band, an amide III band, an amide A band, an OH stretching region or a combination thereof. A representative method includes providing a sample; providing an internal reflecting element (IRE) with a functionalized tip; contacting the sample with the IRE to form a sample-IRE interface; directing a beam of infrared (IR) radiation through the IRE under conditions such that the IR radiation interacts with the sample-IRE interface once; recording a reflectance profile over a range of preselected frequencies, whereby an infrared spectrum of the of a sample having or suspected of having an amide I band, an amide II band, an amide III band, an amide A band, an OH stretching region or a combination thereof, disposed in an aqueous solution is acquired. Representative apparatus includes an internal reflecting element (IRE) comprising a reflection face located on the IRE at a region of intended contact between the IRE and a solublized sample; an infrared radiation source for supplying an evanescent wave of infrared radiation and directing the same from the outside of the IRE to the inside thereof so as to cause the infrared radiation to be incident on the reflection face, wherein the infrared radiation is reflected from the reflection face once; a sample cell; a functionalized tip comprising a surface-immobilized probe that partially or completely fills the volume exposed to the evanescent wave; and a detector for detecting the once-reflected infrared radiation.
Owner:NORTH CAROLINA STATE UNIV

High temperature semitransparent material spectrum direction apparent emissivity inversion measuring device and method

The invention relates to a high temperature semitransparent material spectrum direction apparent emissivity inversion measuring device and method, belongs to the technical field of high temperature physical function material hot measurement and aims to solve the problems of low accuracy, low temperature upper limit, narrow measuring waveband and existence of dead measuring angle in the conventional semitransparent material spectrum direction apparent emissivity measurement. According to the invention, a fourier infrared spectrometer is used for measuring the high temperature normal direction transmissivity and the high temperature normal direction emissivity of a semitransparent material respectively, further the spectral refractivity and the spectral absorption factor of the semitransparent material are computed according to a radiation transfer inverse problem solving method, and finally the high temperature spectrum direction apparent emissivity of the semitransparent material is computed through the spectral refractivity and the spectral absorption factor of the material. The invention provides a method capable of accurately measuring the spectrum direction apparent emissivity of the semitransparent material, and can be widely applied to various fields of aviation, military, energy sources, chemical engineering and atmospheric sciences and the like.
Owner:HARBIN INST OF TECH

Gas measuring apparatus and gas measuring method

A gas measuring apparatus includes: an infrared detecting section that receives an infrared ray from a measurement area and outputs infrared spectrum data relating to the infrared ray; a variation detecting section that detects, by using the infrared spectrum data, a variation in intensity of the infrared ray, which is caused in the infrared ray that radiates from the measurement area and which is caused by a measuring object gas in the measurement area; a converting section that converts the infrared spectrum data to radiance temperature spectrum data which represent wavelengths in an infrared region and radiance temperatures at each wavelength; a background temperature detecting section that detects, as background temperature of the measuring object gas, a maximum radiance temperature from among radiance temperatures represented by the radiance temperature spectrum data; a gas temperature detecting section that detects the temperature of the measuring object gas by using a radiance temperature in a wavelength band included in the water vapor absorption band in the infrared region from among the radiance temperatures represented by the radiance temperature spectrum data; and a computing section that computes surface density of the measuring object gas on the basis of the variation in intensity of the infrared ray, the background temperature of the measuring object gas, and the temperature of the measuring object gas.
Owner:NEC CORP

Hadamard-transform near-infrared spectrograph added with light harvesting structure

The invention discloses a Hadamard-transform near-infrared spectrograph added with a light harvesting structure, and relates to the field of Hadamard-transform near-infrared spectrographs. The spectrograph comprises a light source, the light harvesting structure consisting of a collimation lens and a cylindrical lens, a slit, a collimation lens, a plane grating, a DMD (digital micro mirror device), an imaging lens, a single-point detector, a static drive circuit and a spectral information acquisition and processing system. According to the Hadamard-transform near-infrared spectrograph, the light harvesting structure is added between an optical fiber and the slit, so that the energy utilization ratio of the system for light to be detected is improved greatly, and the detection for near-infrared spectrum is facilitated; appropriate slit width, grating incident angle and the like are selected, then the resolution ratio of the spectrograph is higher, simultaneously, the energy utilization ratio is higher, and the detection capacity of the spectrograph for a weak spectrum signal is improved; and a single-point photodiode is used to perform spectrum detection, accordingly, the spectrograph cost and the spectrograph size are reduced, and the detection sensitivity is improved.
Owner:CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI

Spatial modulation Fourier transform infrared spectrometer based on MOEMS technology

The invention discloses a spatial modulation Fourier transform infrared spectrometer based on the MOEMS technology and relates to the field of spectrum analysis instruments. The spatial modulation Fourier transform infrared spectrometer solves the problems that the FTIR is adopted in the prior art, the size is large, the weight is high, and online reliability is limited. The infrared spectrometer is based on the Michelson interferometer principle, two multistage step reflectors which are arranged in an orthogonal mode are used for replacing a movable mirror system and a fixed mirror in a system, staticizing of the system is achieved, and meanwhile the reliability, the repeatability and the real-time performance of the system are greatly improved. Real-time and online measurement on unknown objects is conveniently achieved. A grid type beam splitter is used for replacing a beam splitter and a compensating plate in a traditional Fourier transform spectrometer, the light weight of the system is achieved, a micro-reflector array is used for replacing a beam contracting system in the traditional Fourier transform spectrometer, and the requirement for the light weight and the microminiaturization of the spectrometer can be better met.
Owner:CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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