The invention discloses a mixed plasma effect assisted slot waveguide TE mode polarization analyzer which successively comprises, from bottom to top, a silicon-base substrate, a buried oxide layer, apolarization analysis component, and an upper cladding layer, wherein the buried oxide layer is grown on the upper surface of the silicon-base substrate, the upper cladding layer covers the upper surface of the buried oxide layer, the polarization analysis component is horizontally grown on the upper surface of the buried oxide layer and covered by the upper cladding layer, and comprises an inputwaveguide, a transition waveguide A, a through waveguide, a transition waveguide B, an output waveguide, and a right through waveguide. The slot waveguide TE polarization analyzer has the advantages of low insertion loss, a high extinction ratio, a large manufacturing tolerance, and a large operating bandwidth.