This invention relates to the field of
machine vision inspection technology, and discloses a method and
system for
electrode inspection based on a combined
light source. By using a combination of an arched
light source and a linear coaxial
light source to illuminate the
electrode, and dynamically adjusting the illumination brightness and edge intensity threshold according to the
silicon content of the
electrode, unified settings for imaging parameters and
edge detection parameters are achieved. This eliminates the need for frequent recalibration for electrodes with different
silicon contents, significantly reducing debugging
workload and improving inspection consistency. Simultaneously, the combined light source can accommodate the imaging needs of electrodes with different
silicon contents, effectively enhancing the
grayscale contrast between the thinned area, slot, and the electrode body. This avoids problems such as unstable
edge detection and misjudgment of wrinkles under a single light source, thus achieving unified and stable detection of various defects such as residual cleaning in the slot, missed cleaning in the slot, and missing foil in the thinned area, meeting the high-quality inspection requirements for electrodes with different silicon contents in
mass production.