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42results about How to "Improve carrier lifetime" patented technology

N-type substrate silicon solar cell and production method thereof

The invention discloses an N-type substrate silicon solar cell and a production method of the N-type substrate silicon solar cell. The N-type substrate silicon solar cell comprises an N-type silicon substrate and is characterized in that an N plus area layer is arranged at one side of the N-type silicon substrate; an antireflection film layer is arranged on the N plus area layer; a positive silver layer is arranged on the antireflection film layer; a P area layer is arranged at the other side of the N-type silicon substrate; and a back electrode layer is arranged on the P area layer and is a metal aluminum layer. The inventionhas the beneficial effects that compared with a P-type substrate silicon solar cell, the N-type substrate silicon solar cell has longer carrier service life, fewer complex defects, small temperature coefficient errors and thin thickness and also has the imponderable advantages in feed; through further improving the process of the N-type substrate silicon solar cell, the conversion efficiency of the solar cell can be more greatly improved, and the electrical property of the solar cell is improved to a large extent; and compared with the P-type substrate silicon solar cell, each N-type substrate silicon solar cell is improved by 0.15W on average, so that the profit on each production line can be greatly increased.
Owner:宁波市鑫友光伏有限公司

Growth method for spin-coating single crystal on wide bandgap semiconductor substrate

The invention belongs to the technical field of perovskite solar cells, photoelectric detectors and wide bandgap semiconductor photoelectric materials and devices, and discloses a growth method for spin-coating single crystal on a wide bandgap semiconductor substrate. The growth method comprises the following steps: respectively cleaning the wide bandgap semiconductor substrate for 30 minutes by using isopropanol, ethanol and deionized water in an ultrasonic cleaning machine, treating the substrate for 15 minutes by using ultraviolet ozone, and thoroughly cleaning the wide bandgap semiconductor substrate; spin-coating lead iodide or an inorganic perovskite precursor solution on the thoroughly cleaned wide bandgap semiconductor substrate by using a spin coater; and carrying out annealing treatment to obtain the high-quality lead iodide and perovskite single crystal film. The invention discloses a technology for growing a high-quality lead iodide and perovskite single crystal thin film by adopting a spin-coating process. By optimizing the proportion of a precursor solution and the growth temperature of the film, lead iodide or a perovskite material grows on the wide bandgap semiconductor substrate by using the spin-coating process, and a high-quality epitaxial single crystal film is obtained and is applied to manufacturing of an efficient photoelectric detector or a solar cell.
Owner:GUANGXI UNIV

Method for prolonging service life of silicon carbide epitaxial wafer carrier

The invention provides a method for prolonging the service life of a silicon carbide epitaxial wafer carrier. The method comprises the following steps: S1, placing a silicon-surface silicon carbide substrate on a graphite base; s2, adjusting conditions in the reaction chamber and growing a buffer layer; s3, the growth temperature and pressure are kept unchanged, the C / Si ratio is reduced, and then the C / Si ratio is increased in a linear gradual change mode for first-time growth; s4, keeping the growth temperature and pressure unchanged, and continuing n times of rate switching gradient layer growth; s5, conditions in the reaction chamber are adjusted, and growth of an epitaxial layer is completed; s6, after epitaxial layer growth is completed, the growth source and the doping source are closed, finally, argon is used for inflating the pressure of the reaction chamber to atmospheric pressure, and then the chamber is opened to take the wafer. According to the invention, the gradient layer design is optimized by adopting the method of growing the plating layer in a stepped manner, the purposes of compensating the carbon vacancy generated by the buffer layer and inhibiting the formation of the carbon vacancy of the gradient layer are achieved, and the carrier lifetime of the silicon carbide epitaxial wafer is greatly prolonged.
Owner:NO 55 INST CHINA ELECTRONIC SCI & TECHNOLOGYGROUP CO LTD

Method for prolonging minority carrier lifetime of silicon carbide epitaxial material

The invention provides a method for prolonging the minority carrier lifetime of a silicon carbide epitaxial material, and the method comprises the steps: 1, placing a SiC substrate in a reaction chamber, and carrying out the vacuum pumping; 2, introducing hydrogen into the reaction chamber, and introducing a carbon source, a silicon source and a doping source for surface treatment; 3, a carbon source, a silicon source and a doping source are introduced into the reaction chamber for growth of a buffer layer; 4, epitaxial layer growth and epitaxial layer doping are carried out; step 5, first-stage cooling: closing the silicon source and the doping source, performing hydrogen atmosphere annealing treatment, and closing the carbon source after annealing is finished; 6, second-stage cooling is conducted, specifically, hydrogen atmosphere annealing treatment is conducted; seventhly, the sixth step is repeated for multiple times till the temperature requirement is met; and 8, reducing the cavity opening temperature, opening the reaction chamber, and taking out the silicon carbide epitaxial material. The method provided by the invention is simple in process and suitable for industrial production; the service life of a carrier is prolonged to the maximum extent, and damage to the surface of the material due to long-time high-temperature annealing can be avoided.
Owner:NO 55 INST CHINA ELECTRONIC SCI & TECHNOLOGYGROUP CO LTD
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