The invention discloses a
system for Young modulus measurement of a film. The
system comprises a
pulsed laser, wherein the
pulsed laser emits pulse
laser, which is divided into 7 / 10 pulse
laser and 3 / 10 pulse
laser by a 3:7 spectroscope after being collimated and broadened by a first
beam expander, and the 7 / 10 pulse laser is focused on the surface of a sample under test through a cylinder focusing lens to generate an acoustic
surface wave signal under excitation; and the acoustic
surface wave signal is converted into an electrical
signal through a first detection channel and / or a second detection channel, and the electrical signal is output to a computer for
processing after being displayed by an oscillograph. The
system not only has the advantages of large signal amplitude, high applicability in testing environment with large disturbance and the like of the piezoelectric laser acoustic
surface wave detection technology, but also inherits the advantages of rapid, accurate and non-contact measurement and high
signal to noise ratio and the like of the difference
confocal laser acoustic surface
wave detection technology; and the system has higher applicability and wider range of applicability. Meanwhile, based on the
advantage of high measurement bandwidth of the difference
confocal laser acoustic surface
wave detection technology, the measurement resolution is greatly improved.