A Raman test system and test method for in-situ testing of LED stress, the test system is equipped with a laser, an optical system, a long-wave pass or band-pass filter, a Raman filter, a microscope, a CCD; a long-wave pass or a band-pass filter It is set at the front end of the microscope optical path, the rear end of the microscope optical path, the front end of the Raman filter, the rear end of the Raman filter or the front end of the CCD, etc. in the Raman optical path, and is combined with a laser whose wavelength is far away from the LED emission spectrum. Test method: first use the microscope to adjust the position of the sample to make the sample focus; turn off the light source of the microscope, turn on the laser, the laser is used to emit the laser light required for Raman testing, the optical path system transmits the input and output signals of the laser, and reflects the light After signal processing and filtering by Raman filter, the final signal is detected by CCD. Improve the signal-to-noise ratio of the Raman signal and realize the in-situ test of LED stress under different current injection conditions.