This application provides an automatic detection method and
system for the
branch circuit of the metallization process of
ceramic wafer capacitors, belonging to the field of
semiconductor technology. Specifically, it includes setting up a detection
branch circuit on the main
production line of
ceramic wafer capacitors, and equipping the detection
branch circuit with a sorting and sampling unit, a branch circuit detection unit, and a central
control unit. The main
production line continuously transports
sintered ceramic wafers to the metallization process. Based on a preset sampling strategy, the central controller controls the sorting and sampling unit to dynamically extract
ceramic wafer samples from the main
production line without interrupting the main production line, and sends the ceramic wafer samples to the branch circuit detection unit for detection. The detection results are uploaded to the central
control unit in real time for quality analysis and dynamic response judgment. Based on the judgment results, a fault alarm is issued or a hard-wired shutdown
signal is sent to the main production line
control unit. This application improves the efficiency and accuracy of quality inspection and effectively avoids the production stoppage problems caused by traditional sampling inspection methods.