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46results about How to "Eliminate the effect of resistance" patented technology

Ternary-system chip negative temperature coefficient thermal resistor

The invention relates to a ternary-system chip negative temperature coefficient thermal resistor, which uses manganese nitrate, nickel nitrate and cobalt nitrate as raw materials and ammonium bicarbonate as precipitator, is prepared by a liquid-phase co-precipitation method, and comprises the following steps: improving the agglomeration phenomenon of the precipitated particles by controlling the molar ratio of nitrate to precipitator ammonium bicarbonate, the reaction temperature and the pH value, washing out the impurities in the product by modes of water washing and alcohol washing to obtain superfine and uniform thermal resistor powder, drying, calcining to obtain evenly dispersed mixed oxide powder of Mn, Ni and Co, briquetting and moulding the powder, isopressing, sintering under high temperature, slicing by a semiconductor to obtain a thermal resistor chip, and encapsulating with epoxy resin to obtain the ternary-system chip negative temperature coefficient thermal resistor with high performance which has the characteristics of good uniformity, high stability, capability of repeatability and interconversion, and is suitable for temperature measurement, control and line compensation in the household appliance field such as refrigerators, air conditioners and the like.
Owner:XINJIANG TECHN INST OF PHYSICS & CHEM CHINESE ACAD OF SCI

High-temperature micro-pressure pressure sensor, and manufacturing method and measuring system thereof

The invention discloses a high-temperature micro-pressure pressure sensor. The high-temperature micro-pressure pressure sensor comprises a sensor chip, a left side compensation circuit, a right side compensation circuit, a power supply electrode pair, a signal detection and extraction electrode pair, a bottom supporting layer, and a peripheral package; the sensor chip comprises overlapped from bottom to top, a silicon bottom layer, a silicon dioxide insulating layer, a silicon carbide top layer, and an uppermost cavity sealing layer; the bottom supporting layer is positioned at the bottom of the sensor chip, and an air vent hole is formed in the middle of the bottom supporting layer; and the peripheral package comprises a stainless steel bottom and a plastic outer casing, and the stainlesssteel bottom and the outer casing are combined to cover the sensor chip. On the basis of an MEMS technology, according to the structure of the high-temperature micro-pressure pressure sensor, sensitivity, linearity, and accuracy of the sensor under a high-temperature environment are greatly improved, high accuracy measurement of air pressure within 0 to 1 kPa under a high-temperature micro-pressure condition can be achieved. The invention further discloses a manufacturing method and a measuring system of the high-temperature micro-pressure pressure sensor.
Owner:NANJING UNIV OF INFORMATION SCI & TECH

Signal collecting circuit

The invention provides a signal collecting circuit which comprises a power supply VCC (Voltage To Current Converter) and a bridge circuit, wherein the bridge circuit is connected with the power supply VCC and used for receiving a voltage provided by the power supply VCC; a first resistor and a temperature sensor are connected with each other in series to form a first bridge arm; a second resistor and a third resistor are connected with each other in series to form a second bridge arm; the first bridge arm and the second bridge arm are connected between the power supply VCC and a ground level in parallel; the temperature sensor in the first bridge arm is connected with the ground level; and resistances of the resistors, which are positioned in the first bridge arm and the second bridge arm and connected with the power supply VCC, are equal to each other. A voltage measuring circuit is respectively connected with middle ends of the two bridge arms of the bridge circuit, so as to measure the voltage value of the temperature sensor from the bridge circuit; the measured voltage values are only the voltages at two ends of the temperature sensor; the resistance of a lead wire connected between the temperature sensor and a detected point does not affect the voltage value of the temperature sensor, measured by the voltage measuring circuit, so that the calculated temperature value is accurate.
Owner:CHONGQING CHANGAN AUTOMOBILE CO LTD +1

High-precision strong anti-interference temperature measurement system and method

The invention discloses a temperature measuring system with high precision and strong interference resistance and a method thereof, and the temperature measuring system consists of temperature sensors and a controlling computer, and is characterized in that the temperature sensors are a plurality of temperature sensors that are respectively arranged on each part of a large-scale astronomical telescope, outputs of the temperature sensors are respectively connected with each temperature survey meter, an analog signal amplifying circuit, an analog-to-digital converter, a data acquisition system, a temperature displaying device and a serial communication circuit are respectively arranged inside each temperature survey meter, which is remotely connected with the controlling computer through the serial communication circuit and the Ethernet. The temperature measuring system adopts the high-precision temperature sensors and temperature survey meters as well as the method that combines hardware with software, thus improving the interference resistant capacity of the system, eliminating power frequency interference and random interference and satisfying the requirement of remote data transmission; simultaneously the temperature measuring system utilizes the Ethernet technique for sampling multi-way temperature data, thus recording and storing measured temperature data in real time and providing reliable foundation for improving astronomical seeing in astronomical observation.
Owner:NANJING INST OF ASTRONOMICAL OPTICS & TECH NAT ASTRONOMICAL OBSE

Heat pump laboratory temperature and humidity control and energy dissipation efficiency testing system and method

The invention relates to a heat pump laboratory temperature and humidity control and energy dissipation efficiency testing system which comprises an upper computer MCGS, a lower computer PLC, a temperature and humidity detecting module, a temperature adjusting module, a humidity adjusting module, a tested air source heat pump set and a heat pump power supply management module. The upper computer MCGS and the lower computer PLC are connected. The temperature and humidity detecting module is connected with the lower computer PLC through an analog quantity collector. The temperature adjusting module is connected with the lower computer PLC. The humidity adjusting module is connected with the lower computer PLC. The tested air source heat pump set is connected with the heat pump power supply management module which is connected with the upper computer MCGS. A water inlet temperature detector, a water outlet temperature detector and a water flow detector are arranged between the tested air source heat pump set and the analog quantity collector. The system has the advantages of being stable, reliable, easy to use and low in price, the energy dissipation efficiency testing system is added, the system is comprehensive and complete, and practicability is strong.
Owner:精英塑胶(珠海)有限公司

Production method for MEMS air mass flow meter with back-cavity structure

The invention relates to a production method for an MEMS air mass flow meter with a back cavity structure. The method comprises the steps of forming composite dielectric film on a surface of a siliconwafer; preparing a metal thermistor thin film pattern through utilization of an exfoliation method; growing a protection layer on the surface of metal thermistor thin film; carrying out high temperature annealing; removing the protection layer on a bonding pad and exposing a metal layer of the bonding pad; carrying out photoetching on the back of the silicon wafer, and carrying out dry etching, thereby forming the back cavity structure; and cutting and splitting chips, thereby finishing processing the chips. According to the method, after photoetching, development and plasma glue extrusion steps are carried out, a deionized water washing step is imported, so residual impurities on the surface of the wafer can be effectively removed after the plasma washing is carried out, the adhesion ofthe metal film on the dielectric film is ensured, and the metal film is prevented from falling off. According to the method, through utilization of a back dry etching technology, a back cavity is realized, and a corrosive effect of corrosive liquid in wet etching for a front pattern structure can be effectively prevented.
Owner:BEIJING INST OF AEROSPACE CONTROL DEVICES

Device and method for measuring power-lossing resistance value of memristor

The invention belongs to the field of a measuring technology, and relates to a device and method for measuring power-lossing resistance value of a memristor. The device and method for measuring the power-lossing resistance value of the memristor are characterized in that a pulse voltage source, a variable resistor and the memristor are mutually connected in a measuring circuit in series. The total length of the memristor is assumed to be D, and thickness change of a doping layer is assumed to be delta w. If the delta is a set error parameter, change of resistance value of the memristor accords with the following formula, wherein Ron is a conduction resistance value when w is equal to D, Roff is the resistance value when w is equal to zero, and epsilon is a set error parameter. The smaller the amplitude U and width d of a pulse voltage source are, the smaller the change of thickness of the doping layer in the memristor in the measuring process is. According to the device, a traditional direct current power source is replaced by the pulse voltage source, so the influence on the resistance value of the memristor can be reduced in the measuring process. The amplitude and the width of pulse voltage signals are adjustable, and the requirements for measuring accuracy and circuit response speed can be met.
Owner:DALIAN UNIV OF TECH

Micro-scale initiating explosive device ignition temperature measuring device

The invention discloses a micro-scale initiating explosive device ignition temperature measuring device. The micro-scale initiating explosive device ignition temperature measuring device comprises a monocrystalline silicon substrate, wherein a silicon dioxide insulating layer is grown on the monocrystalline silicon substrate; a platinum microstructure transduction element and a first electrode connected with the platinum microstructure transduction element are sputtered on the silicon dioxide insulating layer through an MEMS (micro-electromechanical systems) process; the first electrode is used as a voltage input end of the platinum microstructure transduction element; meanwhile, a platinum temperature sensitive element is sputtered in the middle of the platinum microstructure transductionelement by using the MEMS process; the platinum temperature sensitive element is connected with second electrodes; and an input end and an output end of the platinum temperature sensitive element areconnected with the two second electrodes respectively to form a four-wire system measuring method. According to the micro-scale initiating explosive device ignition temperature measuring device, a mature MEMS processing process is combined with the resistance temperature characteristic of a platinum material, so that the micro-scale initiating explosive device ignition temperature measuring device has the characteristics of small size of the sensitive element, high linearity, high measuring accuracy and the like.
Owner:XI AN JIAOTONG UNIV

Silicon carbide MOSFET device integrated with SBD and preparation method thereof

The invention discloses a silicon carbide MOSFET device integrated with an SBD and a preparation method of the silicon carbide MOSFET device. The silicon carbide MOSFET device comprises a substrate, an N-epitaxial layer, a P well region, a P + region of a junction field effect region, a P + region and an N + region of a source groove region, a first ohmic contact metal layer, a first Schottky contact metal layer, a second ohmic contact metal layer and a second Schottky contact metal layer. The P + region of the junction field effect region is positioned on one side, far away from the N + region, of the P well region; the second ohmic contact metal layer covers one surface, deviating from the N-epitaxial layer, of the P + region of the junction field effect region; the first Schottky contact metal layer is located on the side, away from the P well region, of the second ohmic contact metal layer. And the second Schottky contact metal layer is arranged on one side, deviating from the P + region of the junction field effect region, of the second ohmic contact metal layer, and is parallel to the P + region of the junction field effect region. The source contact resistance can be reduced, the through-current capability of the silicon carbide device is improved, and the reliability of the silicon carbide device is improved.
Owner:ZHUZHOU CRRC TIMES SEMICON CO LTD

DC-DC module power supply

The invention discloses a DC-DC module power supply which comprises an enclosure and a circuit mainboard arranged in the enclosure, the circuit mainboard comprises a primary-side circuit and a secondary-side circuit, the primary-side circuit comprises a power conversion circuit, a primary-side driving circuit and a primary-side control circuit, the power conversion circuit adopts a high-frequency power switch, an input DC voltage of 185-340V DC is converted into a 9V low-voltage DC output voltage by a transformer, the secondary-side circuit comprises a synchronous rectification circuit, a secondary-side driving circuit, a secondary-side control circuit and an isolation switch, the synchronous rectification circuit adopts a synchronous rectification switch for synchronous rectification, a low-voltage power pulse is converted into a smooth 9V DC through an output filter, and the smooth 9V DC is output through an anode confluence structure and a cathode confluence structure. The mainboard is reasonable in arrangement and compact in structure, has the advantages of small volume, high reliability, good heat dissipation performance, high anti-interference capability, high isolation and the like, and is mainly applicable for the fields such communication, aeronautics and astronautics and military.
Owner:SICHUAN SHENGHUA POWER TECH CO LTD

Developing roller and process cartridge

The invention relates to a developing roller, which includes a metal mandrel, an intermediate layer and a conductive elastic layer; the intermediate layer includes a support structure and a conductive structure; the support structure is made of hard materials in an integrated manner, and the support structure includes an inner support cylinder , the outer support tube and the spokes connecting the inner support tube and the outer support tube, the inner support tube is set outside the metal mandrel, and the conductive elastic layer is set outside the outer support tube; the inner support tube is formed with a plurality of radially arranged first A through hole, a plurality of radially arranged second through holes are formed on the outer support cylinder; along the axial direction of the developing roller, the spokes extend from one axial end of the intermediate layer to the other axial end of the intermediate layer; conductive The structure is a conductor filled between the inner support cylinder and the outer support cylinder, and in the first through hole and the second through hole, and the conductive elastic layer is electrically connected with the mandrel through the conductor. The developing roller has the advantages of low cost, small deformation of the conductive elastic layer and the like. Furthermore, the present invention also relates to a process cartridge using the above developing roller.
Owner:PROSPECT IMAGE PROD LIMITED OF ZHUHAI

A device for measuring the ignition temperature of micro-scale pyrotechnic products

The invention discloses a micro-scale initiating explosive device ignition temperature measuring device. The micro-scale initiating explosive device ignition temperature measuring device comprises a monocrystalline silicon substrate, wherein a silicon dioxide insulating layer is grown on the monocrystalline silicon substrate; a platinum microstructure transduction element and a first electrode connected with the platinum microstructure transduction element are sputtered on the silicon dioxide insulating layer through an MEMS (micro-electromechanical systems) process; the first electrode is used as a voltage input end of the platinum microstructure transduction element; meanwhile, a platinum temperature sensitive element is sputtered in the middle of the platinum microstructure transductionelement by using the MEMS process; the platinum temperature sensitive element is connected with second electrodes; and an input end and an output end of the platinum temperature sensitive element areconnected with the two second electrodes respectively to form a four-wire system measuring method. According to the micro-scale initiating explosive device ignition temperature measuring device, a mature MEMS processing process is combined with the resistance temperature characteristic of a platinum material, so that the micro-scale initiating explosive device ignition temperature measuring device has the characteristics of small size of the sensitive element, high linearity, high measuring accuracy and the like.
Owner:XI AN JIAOTONG UNIV

Method and device for determining internal resistance of power battery

ActiveCN108663634BAccurate estimation of available capacityGuaranteed healthy operationElectrical testingPower batteryElectrical battery
The present invention provides a method and device for determining the internal resistance of a power battery. The method includes: acquiring historical data records of the power battery of an electric vehicle; The theoretical internal resistance value; determining the internal resistance correction parameter; using the internal resistance correction parameter to correct the theoretical internal resistance value to obtain the actual internal resistance value of the power battery within a specified time period. The present invention calculates the theoretical internal resistance value according to the historical data records, and corrects the theoretical internal resistance value through the internal resistance correction parameter to obtain the actual internal resistance value, and does not need to measure the internal resistance of the battery by adding a direct current with a change in size, thus avoiding the complicated measurement operation of the method At the same time, the influence of temperature on the internal resistance of the battery is eliminated through the internal resistance correction parameter, and the actual internal resistance obtained is highly accurate, which facilitates accurate estimation of the available capacity of the battery and maintains the healthy operation of the electric vehicle power battery.
Owner:SHENZHEN KELIE TECH
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