The invention discloses an anti-
radiation photosensitive
transistor and
electronic equipment, and relates to the technical field of transistors, the anti-
radiation photosensitive
transistor comprises a substrate, a channel layer, a
gate dielectric layer, an
electrode structure and a two-dimensional
semiconductor material layer; the channel layer is located on the substrate, is made of a high-forbidden-bandwidth
semiconductor material and comprises a non-photosensitive functional region and a solar-blind photosensitive region, and the non-photosensitive functional region and the solar-blind photosensitive region form an RESURF structure through in-situ
doping gradient transition; the
gate dielectric layer is located between the gate and the solar-blind photosensitive region and is made of a high-
dielectric-constant material; the two-dimensional
semiconductor material layer is located between the source
electrode and the solar-blind photosensitive region, and the two-dimensional semiconductor material layer and the material of the solar-blind photosensitive region form a Van der Waals
heterojunction. The integrated structure synergistically improves the
extreme environment radiation resistance, solar blind photosensitive sensitivity and single particle burning resistance reliability of the device, enhances the total ionizing
dose resistance, uniformizes
electric field distribution, relieves interface stress, optimizes carrier transport, inhibits trapped charge accumulation and local
thermal runaway, and gives consideration to high photosensitive response and high
breakdown voltage. And the method adapts to extreme high-
voltage scenes.