The invention discloses a controllable high-frequency-response probe test moving device for
microwave and
millimeter wave chips. The controllable high-frequency-response probe test moving device comprises an industrial
personal computer, a control module, a driver, a
servo motor, a precision displacement device and a
grating ruler. The precision displacement device comprises a precision
workbench, a driver I, piezoelectric ceramics and a flexible hinge. The industrial
personal computer is connected with the control module, the control module is connected with the driver, the driver is connected with the
servo motor, the
servo motor is connected with the driver through an
encoder, the servo motor is connected with the precision
workbench, the precision
workbench is connected with the driver I, the driver I is connected with the piezoelectric ceramics, the piezoelectric ceramics is connected with the flexible hinge, the flexible hinge is connected with the workbench, the workbench is connected with the control module through the
grating ruler, the driver I is connected with the control module, prior one-time positioning is changed into coarse positioning in which the motor drives a lead screw, and the precision displacement device belongs to secondary positioning of fine positioning. A fine
positioning system is high in test speed, and on the premise of not affecting test acceptability, test cycle is shortened greatly, efficiency and productivity are improved, and test cost is reduced.