The invention discloses a controllable high-frequency-response probe test moving device for microwave and millimeter wave chips. The controllable high-frequency-response probe test moving device comprises an industrial personal computer, a control module, a driver, a servo motor, a precision displacement device and a grating ruler. The precision displacement device comprises a precision workbench, a driver I, piezoelectric ceramics and a flexible hinge. The industrial personal computer is connected with the control module, the control module is connected with the driver, the driver is connected with the servo motor, the servo motor is connected with the driver through an encoder, the servo motor is connected with the precision workbench, the precision workbench is connected with the driver I, the driver I is connected with the piezoelectric ceramics, the piezoelectric ceramics is connected with the flexible hinge, the flexible hinge is connected with the workbench, the workbench is connected with the control module through the grating ruler, the driver I is connected with the control module, prior one-time positioning is changed into coarse positioning in which the motor drives a lead screw, and the precision displacement device belongs to secondary positioning of fine positioning. A fine positioning system is high in test speed, and on the premise of not affecting test acceptability, test cycle is shortened greatly, efficiency and productivity are improved, and test cost is reduced.