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6 results about "Diffusion current" patented technology

Diffusion Current is a current in a semiconductor caused by the diffusion of charge carriers (holes and/or electrons). This is the current which is due to the transport of charges occurring because of non-uniform concentration of charged particles in a semiconductor. The drift current, by contrast, is due to the motion of charge carriers due to the force exerted on them by an electric field. Diffusion current can be in the same or opposite direction of a drift current. The diffusion current and drift current together are described by the drift–diffusion equation.

Transformer physical state calculation method and device, storage medium and program product

The invention discloses a transformer physical state calculation method and device, a storage medium and a program product, and relates to the technical field of power equipment monitoring. The method comprises the following steps: constructing an electromagnetic field model of a tested transformer based on a structure measurement result of the tested transformer; coupling the solid structure and the electromagnetic field of the measured transformer, and solving the electromagnetic field model by using the measured Lorentz force of the transformer box body to obtain the non-diffusion current density of each space point in the transformer box body; based on the non-diffusion current density, Joule thermal power of a coil of the tested transformer is calculated, and the coil temperature of the tested transformer is calculated based on the Joule thermal power of the coil of the tested transformer; and based on the non-diffusion current density, calculating the Joule thermal power of the transformer box body, and based on the Joule thermal power of the transformer box body, calculating the temperature of the transformer box body. According to the invention, general, sustainable and accurate detection of the operating temperature of the transformer is realized.
Owner:GUANGYUAN POWER SUPPLY COMPANY OF STATE GRID SICHUAN ELECTRIC POWER

Residual chlorine meter and control method thereof, and chlorine meter system

The present application relates to a residual chlorine meter, a chlorine meter system, and a control method for a residual chlorine meter. A spare part for a residual chlorine meter can be replaced at a more appropriate time. A residual chlorine meter that measures the concentration of residual chlorine in a water sample is provided with an indicating electrode and a counter electrode that are immersed in the water sample, and a control unit that measures the concentration of residual chlorine in the water sample based on a diffusion current that flows between the indicating electrode and the counter electrode when a voltage is applied between the indicating electrode and the counter electrode, and detects the degree of deterioration of a spare part for the residual chlorine meter based on at least either of a motor current that flows through a motor that rotates the indicating electrode in the water sample and the diffusion current.
Owner:YOKOGAWA ELECTRIC CORP

A method for measuring the thickness of a diffusion layer at a wafer level

A wafer-level diffusion layer thickness measurement method converts limiting diffusion current into diffusion layer thickness, realizes evaluation of mass transfer performance of different types of electroplating tanks in the same dimension, overcomes the problem of great difference between electric field, flow field, concentration field and wafer-level electroplating copper process in the test electrolytic cell, is closer to the actual electroplating process, and can guide the understanding of TSV hole, bump, RDL and other electroplating copper processes.
Owner:XIAMEN UNIV

Passivation efficacy testing method, device and system, computer equipment and storage medium

The invention relates to a passivation efficacy test method, device and system, computer equipment and a storage medium, and the method comprises the steps: carrying out the dark-state volt-ampere test of a perovskite photovoltaic cell, obtaining the volt-ampere characteristic parameters, carrying out the fitting analysis through combining with the volt-ampere characteristic parameters, obtaining the diffusion current and generated current of the perovskite photovoltaic cell in a reverse bias state, and obtaining the passivation efficacy of the perovskite photovoltaic cell. Finally, the diffusion current and the generated current are combined for analysis and calculation, and passivation efficiency parameters representing the passivation efficiency of the perovskite photovoltaic cell in the current state can be obtained. Through the scheme, the passivation potency parameter of the perovskite photovoltaic cell can be analyzed and calculated by adopting a simple volt-ampere test mode without a complex algorithm, that is, the performance evaluation of the passivation material of the perovskite photovoltaic cell is realized, the evaluation algorithm is simple, and the calculation cost is greatly reduced.
Owner:CONTEMPORARY AMPEREX TECHNOLOGY CO LTD

Light emitting diode and method of manufacturing the same

ActiveCN114709313BLight-emitting diodeDiffusion current
The application provides a light emitting diode and a preparation method thereof. The light emitting diode comprises a GaN layer and a transparent insulating film layer deposited on the GaN layer, the transparent insulating film layer is used for blocking current, the GaN layer comprises a flat area and a current conducting part opened on the flat area, the current conducting part comprises a platform recessed from one end of the transparent insulating film layer and a sidewall connecting the flat area and the platform, and the transparent insulating film layer is deposited on the outer ring of the platform, the sidewall and the flat area close to the sidewall. The application can effectively and uniformly diffuse current, thereby improving the brightness of the LED chip. In addition, since the current is uniformly diffused, the heat accumulation phenomenon of the chip in use is effectively improved, thereby achieving the purpose of prolonging the service life of the chip.
Owner:JIANGXI ZHAO CHI SEMICON CO LTD

A method for detecting the limiting diffusion current density of lithium-ion batteries during fast charging

This application discloses a method for detecting the limiting diffusion current density of a lithium-ion battery during fast charging. The method includes: obtaining the negative electrode system and electrolyte system in a testing device based on the lithium-ion battery system to be tested; sequentially stacking a first electrode, a first separator, a first reference electrode, a second separator, and a second electrode in the first electrolyte of the testing device to form a battery circuit; the second electrode includes: a first current collector with a groove on one side, and two reference electrodes disposed in the groove; a negative electrode active material layer disposed on at least one side of the first current collector; and an insulating encapsulation film disposed between the negative electrode active material layer and the first current collector; operating the testing device and charging the battery circuit with a first preset current in i cycles and a second preset current in i+1 cycles; detecting the potential difference between the first reference electrode and the second reference electrode, determining the maximum potential difference, and taking the charging current density at the first occurrence of the maximum potential difference as the limiting diffusion current density.
Owner:BEIJING INST OF TECH