2 results about "Production chain" patented technology

This invention discloses a data management and control system for the entire production process of silicone rubber products based on digital twins, belonging to the field of silicone rubber production management and control technology. It includes a data acquisition module, a twin construction module, a simulation driving module, and a quality field module. The data acquisition module collects real-time physical data of the entire production chain of silicone rubber products from raw materials to finished products. The twin construction module establishes a virtual digital twin of the physical production line. The simulation driving module injects real-time production data into the twin and drives synchronous simulation to generate a sequence of state parameters. The quality field module performs dynamic field analysis on the state parameter sequence, constructs an adaptive mesh topology that dynamically deforms with the parameters, and generates dynamic quality streamlines representing the quality transfer path between the topology nodes. This system realizes synchronous simulation of the entire silicone rubber production process and digital representation of the quality transfer process.

The present application relates to the technical field of non-woven fabric production quality control, in particular to a quality tracing method and system for EVA laminated non-woven fabric products, comprising: synchronously collecting time sequence process parameters of the whole production chain through a sensor network to generate original parameter flow bound with production volume, obtaining baseline, rhythm and disturbance components through multi-scale decomposition, and mapping them to product raw material layer, interface bonding layer and surface layer to generate layered quality parameter set. A defect mode sample library is constructed, potential defect evolution paths are identified through unsupervised clustering, dynamic matching degree between current parameter set and early stage of defect evolution path is calculated in real time, and if the dynamic matching degree exceeds the threshold, parameter tracing and root cause positioning of the corresponding process link are triggered. The present application realizes the hierarchical correlation between process parameters and product structure, can identify defect evolution characteristics in advance, and improves the accuracy and proactivity of EVA laminated non-woven fabric quality tracing.