The invention relates to an external
ion source for a time-of-flight
mass spectrometer. The external
ion source comprises a gas sample inlet, an
ionization chamber, a filament, a slit, a repulsion
electrode, a magnetic pole, an
ion lead-out slit, a heating rod, a temperature probe and a fixing rod. An external
ion source device disclosed by the invention takes the gas sample inlet as a starting point and the repulsion
electrode as a circle center; the fixing rod, the filament, the slit, the temperature probe, the heating rod, a dual-gas sample inlet, the fixing rod and the magnetic pole are orderly arranged on the
ionization chamber in a
clockwise direction; the filament, the slit, the repulsion
electrode and the magnetic
pile are on the same axis; the ion lead-out slit is parallel to the axis, and the repulsion electrode is an
ellipse repulsion electrode. Compared with the prior art, the time-of-flight
mass spectrometer has the advantages of being simple in structure, compact in structure, light in weight, less in
energy consumption, high in
ionization rate and convenient to clean and maintain; a multi-channel gas sample inlet is convenient to carry out inner reaction of a plurality of gas ion sources; the ion sources are heated unilaterally, the
energy consumption and deposited carbon are reduced, and the time-of-flight
mass spectrometer is suitable for an online and portable time-of-flight mass spectrometer
ion source.