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59results about How to "Improve current conduction ability" patented technology

Winding lithium paste battery

The present invention provides a winding lithium paste battery. The winding lithium paste battery has a battery cell formed by winding of a positive plate and a negative plate, the electrode active conductive material layer of the electrode piece comprises non-bonded and fixed electrode active conductive particles. The winding lithium paste battery further comprises a leakage preventing portion, the leakage preventing portion is arranged at the edge of the positive plate and/or the negative plate or arranged on a housing to prevent the positive pole active conductive particles in the positivepole active conductive material layer from being leaked from the positive plate and/or prevent the negative pole active conductive particles in the negative pole active conductive material layer frombeing leaked from the negative plate. The winding lithium paste battery is more compact in structure, can regulate the shape for the application occasions, and is convenient and flexible in application. Besides, the winding lithium paste battery employs the uniformly distributed multi-tab group or full-tab design to effectively improve the current conduction capacity, improve the current distribution and improve the utilization rate of the electrode active conductive materials.
Owner:BEIJING HAWAGA POWER STORAGE TECH +1

High-current full-wafer full-crimp flat-pack IGBT and manufacturing method thereof

The invention discloses a heavy-current whole-wafer total-pressure-contact flat-plate encapsulated IGBT (Insulated Gate Bipolar Transistor) and a manufacturing method thereof. The heavy-current whole-wafer total-pressure-contact flat-plate encapsulated IGBT comprises an IGBT whole wafer and a total-pressure-contact flat-plate encapsulation, the whole wafer comprises multiple independent IGBT device regions, each IGBT device region is composed of multiple IGBT units which are connected in parallel, collectors of all the IGBT device regions are connected in parallel to form a total collector, atransmitter is led from each IGBT device region independently, gate poles of all the IGBT device regions in a normal operating state are connected to a total gate pole arranged in the center of the wafer by using an interconnecting line, and the transmitter of each IGBT device region is connected with a metal electrode plate of a total transmitter in parallel by virtue of a metal gasket of the transmitter. According to the invention, a heavy-current IGBT whole wafer device is realized, the advantages of high working voltage, low switching power consumption and simple voltage control of the gate pole are maintained, current carrying capacity, heat-conducting property, heat shock resistance and long-term reliability of the device are improved, and the problem of property matching between IGBT units is solved.
Owner:HUNAN UNIV

Organic electroluminescence component and manufacturing method thereof

The invention relates to an organic electroluminescence component and a manufacturing method thereof. The organic electroluminescence component comprises a basal plate, wherein a first electrode, an organic material layer, a second electrode and a sealing layer are sequentially formed on the basal plate, the first electrode is used as an anode, and the second electrode is used as a cathode and is a composite transparent structure layer for realizing the light emitting at the top. By forming the composite transparent cathode emitting light at the top, the invention enables the organic electroluminescence component to emit the light from the top and enhances the light-emitting utilization rate and the light transmission rate effectively, which not only enhances the aperture opening ratio of a display screen but also can obtain better display effect. Meanwhile, by adding a netty confluence layer on a semitransparent metal layer with high resistance, the invention ensures high transmissivity, also enhances the conducting power of current, meets the requirement of a top transmission type organic electroluminescence component effectively and can be applied to a display device with double-face display. The invention has simple and reliable structure and preparation process and extensive application prospect.
Owner:BOE TECH GRP CO LTD

Latch-preventing N type silicon on insulator transverse isolated gate bipolar transistor

ActiveCN102760761AImprove latching abilityLower on-resistanceSemiconductor devicesPower flowBody contact
The invention discloses a latch-preventing N type silicon on insulator transverse isolated gate bipolar transistor which comprises an N type substrate, wherein the N type substrate is provided with buried oxide, the buried oxide is provided with an N type epitaxial layer, and the N type epitaxial layer is internally provided with an N type buffering trap and a P type body region; the N type buffering trap is internally provided with a P type positive region, the P type positive region is provided with an N type negative region and a P type body contact region, and the surface of the N type epitaxial layer is provided with a gate oxide layer and a field oxide layer; and the surfaces of the N type negative region and the P type body contact region are provided with shallow P type trap regions, the surface of the gate oxide layer is provided with a polysilicon gate, and the surfaces of the field oxide layer, the P type body contact region, the N type negative region, the polysilicon gate and the P type positive region are provided with a passivation layer respectively. The transverse isolated gate bipolar transistor is characterized in that the positive inferior of the shallow P type trap region is also provided with a deep P type trap region is arranged under the shallow P type trap region, which shares one photoetching plate together with the shallow P type trap region and is formed by injection of high energy ions; and the deep P type trap region effectively reduces the conduction resistor of a body region, the current capacity of a device is improved, and meanwhile, and the risk of the latch generated in a working process is reduced.
Owner:SOUTHEAST UNIV

Forming method of power supply connector

The invention discloses a forming method of a power supply connector. The forming method comprises the forming steps of processing and forming slender round bar materials by carrying out at least twice cold drawing and stretching processing treatments on terminal round bar materials; punching and forming one ends of the slender round bar materials into terminal butt-joint parts; punching, processing and forming appropriate positions at the rear parts of the slender round bar materials into connecting parts; respectively embedding the slender round bar materials in each locating clamping groove of a terminal material strap one by one, and cutting the slender round bar materials into terminals in preset lengths; respectively locating a plurality of terminals in each locating clamping groove of the terminal material strap after the terminals are formed by repeating the processing mode; embedding the local parts of the butt-joint parts and the connecting parts of two adjacent terminals on the terminal material strap in a die cavity of a forming die, ejecting, processing and forming insulation bodies at the outer parts of the two terminals by utilizing plastics, and separating the two terminals from the terminal material strap; forming the power supply connector after the forming die is removed. According to the forming method disclosed by the invention, the purposes of increasing the working efficiency and reducing the manufacturing cost can be achieved.
Owner:RIIDEA

Latch-up resisting N-type SOI laterally diffused metal oxide semiconductor

ActiveCN102769038AImprove latching abilityLower on-resistanceSemiconductor devicesHigh energyBody contact
A latch-up resisting N-type SOI (Silicon On Insulator) laterally diffused metal oxide semiconductor (LDMOS) comprises an N-type substrate, wherein a buried oxide is arranged on the N-type substrate; an N-type epilayer is arranged on the buried oxide; an N-type buffering well and a P-type body region are arranged in the N-type epilayer; an N-type drain region is arranged in the N-type buffering well; an N-type source region and a P-type body contact region are arranged in the P-type body region; a gate oxide and a field oxide are arranged on the surface of the N-type epilayer; a shallow P-type well region is arranged on the surfaces of both the N-type source region and the P-type body contact region; a polysilicon gate is arranged on the surface of the gate oxide; and a passivation layer is arranged on the surfaces of the field oxide, the P-type body contact region, the N-type source region, the polysilicon gate and the N-type drain region. The latch-up resisting N-type SOI-LDMOS is characterized in that a deep P-type well region sharing the same photoetching board together with the shallow P-type well region and formed by high-energy ion implantation is arranged right below the shallow P-type well region, and the deep P-type well region effectively reduces the conducting resistance of the body region and lowers the latch-up risk in the working process while improving the current capacity of devices.
Owner:SOUTHEAST UNIV

Self-locking chuck and electrode slice connecting device

PendingCN108310624AEnsure structural stabilityAvoid sudden changes in therapeutic currentExternal electrodesAgricultural engineeringSelf locking
The invention provides a self-locking chuck and an electrode slice connecting device, and the self-locking chuck does not get loose, and is safe in treatment, good in electrical conductivity, low in cost and good in universality. The self-locking chuck comprises an upper cover, a lower cover and a turning plate; the upper cover and the lower cover are buckled and connected, a clamping channel is formed between the upper cover and the lower cover, a connecting shaft is fixedly arranged at the front end of the upper cover, a half open shaft sleeve is arranged in the eccentric position of the turning plate, a front protruding part and a rear protruding part are arranged at the lower part of the turning plate, the shaft sleeve is correspondingly arranged at the upper end of the rear protrudingpart, the connecting shaft is sleeved with the turning plate through the shaft sleeve, a metal elastic sheet is arranged in the clamping channel, the lower end face of the metal elastic sheet is abutted against the lower cover, the upper end face of the metal elastic sheet is abutted against the rear protruding part and the upper cover respectively, and a wire extending outwards is arranged on the rear part of the metal elastic sheet. The electrode slice connecting device comprises an electrode slice and the self-locking chuck; the electrode slice comprises an electric conduction main body, atransition section and an extending end; the extending end is connected with the electric conduction main body through the transition section, and the front end of the transition section and the extending end are arranged in the clamping channel.
Owner:JIANGSU ZONP TECH

High-performance and high-integration-level L-shaped gate-control schottky barrier tunneling transistor

The invention relates to a high-performance and high-integration-level L-shaped gate-control schottky barrier tunneling transistor. A schottky barrier formed between a source electrode and an intrinsic silicon source section is used as a tunneling barrier of a device, the characteristic that the barrier height of the schottky barrier is smaller than the silicon band gap is adopted, on the premise that materials narrower than the silicon band gap do not need to be introduced, the tunneling probability higher than that of a common silicon-material-based PIN type tunneling field effect transistor is achieved, and therefore the subthreshold slope and the electric current conduction capacity of the device are accordingly improved. An L-shaped gate electrode is adopted for controlling an intrinsic silicon channel region with the groove structure characteristics; on one hand, the good control effect on the width of the schottky barrier is achieved; on the other hand, the control effect of the gate electrode on a heavy doping drain electrode region is weakened, and the high-performance and high-integration-level L-shaped gate-control schottky barrier tunneling transistor which has the steep subthreshold slope, the good switching characteristic, the high conduction current, the reversed low leakage current and the quiescent dissipation and is suitable for serving as a deep nanoscale integrated circuit design basic unit is achieved.
Owner:SHENYANG POLYTECHNIC UNIV

Semiconductor device and forming method thereof

The invention provides a semiconductor device and a forming method thereof. The method comprises the following steps that a semiconductor substrate is provided, wherein the semiconductor substrate comprises a first region and a second region; fin parts are arranged on the first region and the second region of the semiconductor substrate respectively; the fin parts comprise a plurality of first finpart layers and second fin part layers which are stacked in a staggered mode in the normal direction of the surface of the semiconductor substrate, and the second fin part layers are located betweenthe adjacent first fin part layers; a pseudo gate structure which only spans the fin parts of the first region is formed; a dielectric layer is formed on the first region and the second region of thesemiconductor substrate, and the fin parts in the first region and the fin parts in the second region, wherein the dielectric layer covers the side wall of the pseudo gate structure and exposes the top surface of the pseudo gate structure; then the pseudo gate structure and the second fin part layers covered by the pseudo gate structure are removed; then a first through hole and a second through hole which penetrate through the dielectric layer are formed in the dielectric layer in the second region; a first doping layer is formed in the fin parts at the bottom of the first through hole; and asecond doping layer is formed in the fin parts at the bottom of the second through hole. According to the method, the performance of the semiconductor device is improved.
Owner:SEMICON MFG INT (SHANGHAI) CORP +1

Planar power MOSFET device integrated with junction barrier Schottky diode

PendingCN114400255AResolving Conflicting Technical IssuesImprove current conduction abilityDiodePower MOSFETJFET
The invention discloses a planar power MOSFET (Metal-Oxide-Semiconductor Field Effect Transistor) device integrated with a junction barrier Schottky diode, which is used for solving the technical problem that conflicts exist when existing junction barrier Schottky cells and MOSFET cells jointly occupy an active region part of the device. The device comprises an epitaxial layer; a plurality of cells with the same shape and structure are distributed on the first side surface of the epitaxial layer; each cell at least comprises a well region, a source region, a highly doped P-type region and a Schottky region; the well region is in contact with the highly-doped P-type region, and the highly-doped P-type region surrounds the Schottky region; junction field effect transistor (JFET) regions are formed between adjacent well regions. A first PN junction is formed between the well region and the epitaxial layer; a second PN junction is formed between the well region and the source region; the value range of the width of the JFET region and the value range of the spacing of the highly doped P-type region are in the same preset interval. Through the device, the problem that conflicts exist when junction barrier Schottky cells and MOSFET cells jointly occupy the active region part of the device is solved.
Owner:海科(嘉兴)电力科技有限公司

Flexible connecting device for generator rotor conducting rod

The invention discloses a flexible connecting device for generator rotor conducting rods. The flexible connecting device comprises connecting copper bars. The connecting copper bars are V-shaped flexible connecting copper bars. The number of the V-shaped flexible connecting copper bars is two. The two V-shaped flexible connecting copper bars are symmetrically arranged in an exciter shaft or a collector ring shaft. One ends of the connecting copper bars are fit with the conducting rods in the exciter shaft or the collector ring shaft, and the other ends of the connecting copper bars are fit with the conducting rods in a generator shaft. Operating holes and ventilating holes at different radial positions are arranged on the exciter shaft or the collector ring shaft. The flexible connecting device for generator rotor conducting rods has the advantages that the assembling process is simple and the assembling accuracy and the operating difficulty are reduced; the flexible structures of the connecting copper bars can absorb deformation caused by the heating of the conducting rods at the two ends and harmful thermal stress is eliminated; the air friction loss and the noise are reduced, the device is not apt to be polluted by foreign matters and the operation reliability is improved; and the ventilating holes and the operating holes can jointly form a cooling air duct to ventilate and cool the V-shaped connecting copper bars and the conducting rods and take the effects of reducing temperature and improving current conducting performance.
Owner:DONGFANG ELECTRIC MACHINERY

Schottky barrier high current density igbt device

The invention discloses a Schottky barrier high-current-density IGBT device comprising a P type base region, a poly silicon gate region, a N- type doped drift region in contact with the bottom surface of the P-type base region, a first device in contact with the bottom surface of the N- type doped drift region, a Schottky barrier region, a N+ type doped source region, an emitter metallic region, and a gate oxide layer. The Schottky barrier region and the N+ type doped source region are in contact with the top surface of the P type base region. The emitter metallic region is in contact with the Schottky barrier region and the N+ type doped source region. The emitter metallic region is arranged between the poly silicon gate region and a group including the N- type doped drift region, the P type base region, the N+ type doped source region, and the emitter metallic region. While advantages of high operating voltage, simple gate voltage control, good switching controllability, a safe operating area, and simple short circuit protection measures are maintained, the Schottky barrier high-current-density IGBT device is greatly increased in current density, improved in conductivity modulation effect and current conduction capability, and decreased in on-state loss.
Owner:HUNAN UNIV

Device for detecting insulating property of vacuum coating nano-film layer of mobile phone rear cover

The invention discloses a device for detecting the insulating property of a vacuum coating nano film layer of a mobile phone rear cover. The device includes a main controller, a supplied material conveying device which is used for conveying supplied materials of the vacuum coating mobile phone rear cover, a supplied material sensing and positioning device is used for sensing supplied materials ofthe rear cover of the vacuum coating mobile phone and positioning the supplied materials of the rear cover of the vacuum coating mobile phone, an automatic resistance measuring device which is used for measuring the resistance value of the positioned supplied material nano-film layer of the rear cover of the vacuum coating mobile phone; a laser coding device which is used for coding product identification codes on the edge of the vacuum coating mobile phone rear cover incoming material with qualified insulation performance; and a supplied material rear surface film coating device which performs film coating on the back surface of the rear cover supplied material of the vacuum coating mobile phone of which the insulating property is detected as qualified and comprises a printed product identification code and the rear cover supplied material of the vacuum coating mobile phone of which the insulating performance is detected as qualified; the device has the advantages that the vacuum coating mobile phone rear cover incoming material resistance value can be automatically measured so as to evaluate the insulation performance, manpower is saved, and the labor cost is reduced.
Owner:深圳市嘉德真空光电有限公司

Lightning prevention system used for environment monitoring station and use method of lightening prevention system

The invention relates to a lightening prevention system used for an environment monitoring station. The system comprises an indoor lightning prevention protection unit and an outdoor lightning protection unit. The indoor lightning protection unit comprises a power supply primary lightning preventer, a power supply secondary lightning preventer, a power supply three-level lightning preventer, a power supply four-level lightning preventer, a network signal lightning preventer, a signal surge protection device, a current collection box and a first grounding unit. The first grounding unit comprises a first copper bar connected to a secondary downlead, a first plasma grounding pole and a first non-metal grounding body. The outdoor lightning protection unit comprises a lightning avoiding device.The lightning avoiding device comprises a support rod. An attenuation lightning arrester is installed on the top of the support rod. A second grounding unit is connected to the bottom of the support.The contact parts between the plasma grounding pole and the non-metal grounding body and the soil are filled with resistance reducing agent. According to the invention, the system is advantaged by high lightning protection grade, good protection effects on devices and wires, reduction of guiding in of earth current and quick conduction speed.
Owner:HENAN YANGBO LIGHTNING PROTECTION TECH

Connector process assembly line and production method thereof

The invention discloses a connector assembly process assembly line and a production method thereof. The assembly line comprises a double-line cutting and winding system, a rotary double-face tin soldering system, a double-line protection type injection molding system, an on-off high-voltage testing device, a labeling device and a packaging device. After a cable passes through the double-wire cutting winding system, the cable is conveyed to the rotary double-face tin soldering system through a conveying belt and conveyed to the double-wire protection type injection molding system through the conveying belt, injection molding is carried out on a cable section and a plug tin soldering part, a finished product obtained after injection molding is a connector, and the automatic winding function is completed through cooperation of a channel and a cylinder in an inclined column disc. Tin at the tin dipping part of a wire head inserted into a plug is simultaneously melted by utilizing heat of a welding gun, double-sided tin soldering is realized, a preheating area and a high-temperature area are arranged in a double-wire protection type injection molding system, TPU (thermoplastic polyurethane) fluid is uniformly injected into a double-wire cooling protection mold, and meanwhile, a cooling loop is designed in the double-wire cooling protection mold, so the TPU raw material is quickly cured and formed in the mold cavity.
Owner:图尔克(天津)科技有限公司
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