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32 results about "Borenium ion" patented technology

A boranylium ion is an inorganic cation with the chemical formula BR⁺₂, where R represents a non-specific substituent. Being electron deficient, boranylium ions form adducts with Lewis bases. Borenium ions are of some interest to academic research.

Boron isotope abundance measuring method using carbon nanotube as ion emitting agent

The invention discloses a boron isotope abundance measuring method using a carbon nanotube as an ion emitting agent. The boron isotope abundance measuring method comprises the following steps: (1) preparing a sample: preparing a carbon nanotube suspension, preparing a generating agent solution, and preprocessing rhenium strips; (2) loading the sample: manufacturing one of the rhenium strips of a preprocessed double-strip insert into a sample strip, and loading the sample strip together with an ionization strip onto a sample turnplate for following measurement; and (3) measuring the sample: sending the strip-loaded turnplate into an ion source, starting a spectrometer, heating the sample strip and the ionization strip, and when ion current occurs, starting data collection. By using the carbon nanotube as the ion emitting agent and by optimizing a sample preparing method, a sample loading technology and measuring conditions during use of the carbon nanotube as the ion emitting agent, the boron ion emitting intensity and the ionization efficiency are significantly improved and the stability of an ion flow is also improved to some extent, the measuring accuracy is improved, and the sample loading amount and the measuring temperature are reduced.
Owner:NUCLEAR POWER INSTITUTE OF CHINA

Adsorbent for removing boron from desalinated seawater as well as preparation method and application of adsorbent

The invention belongs to the field of deboration of desalinated seawater, and relates to an adsorbent for removing boron from desalinated seawater as well as a preparation method and application of the adsorbent for removing boron from desalinated seawater. Nano ferroferric oxide particles are used as a matrix, and chemical modification is performed on the nano ferroferric oxide particles by using SiO2; and finally, N-methyl glucosamine with specific selectivity is introduced for boron, thereby conveniently preparing a novel magnetic boron-removing adsorption material. The prepared material is used for the boron removal process of desalinated seawater, and a product with excellent performance is provided for the application of removing boron ions in the desalinated seawater. Experimental results show that the prepared material is excellent in adsorption performance, and the static boron removal rate can reach 81.21-97.42%. The prepared material has ferromagnetism and boron removal specificity, is convenient to prepare and recycle, is suitable for the boron removal process of a low-boron-content system, and avoids the problem of environmental pollution in a traditional adsorbent preparation method. The adsorbent has a potential application prospect in seawater desalination and boron removal.
Owner:WATER RESOURCES RES INST OF SHANDONG PROVINCE +1

MgO-loaded activated carbon as well as preparation method and application thereof

The invention belongs to the technical field of water treatment, and relates to MgO-loaded activated carbon as well as a preparation method and application thereof. The preparation method of the MgO-loaded activated carbon comprises the following steps: (a) impregnating activated carbon with the water content of less than or equal to 1% in a strong oxidant solution, carrying out solid-liquid separation on an obtained impregnated product, and washing and drying an obtained solid product to obtain pre-oxidized activated carbon; and (b) uniformly mixing the pre-oxidized activated carbon and a magnesium salt solution, dropwise adding a polyethylene glycol solution into the obtained mixture, carrying out vigorous stirring reaction at room temperature of 50 DEG C, carrying out solid-liquid separation on the obtained reaction product, drying the obtained solid product, and calcining at high temperature under the protection of inert gas to obtain the MgO-loaded activated carbon. The MgO-loaded activated carbon obtained by the method provided by the invention can more quickly and effectively adsorb boron ions in seawater and / or boron industrial sewage so as to obtain desalinated water with boron content meeting the standard, and meanwhile, the environmental problem is greatly solved.
Owner:INST OF URBAN ENVIRONMENT CHINESE ACAD OF SCI

A kind of manufacturing method of high voltage fast soft recovery diode

The invention discloses the manufacturing method of a high-voltage fast soft recovery diode. The method comprises the following steps of carrying out phosphorus ion implantation on the lower surface of a silicon wafer, after oxidation and high temperature propulsion, forming a n buffer layer possessing a deep junction and a low-doped concentration gradient; then, carrying out boron ion implantation on an upper surface, after oxidation propulsion, forming a p anode area, a p resistor area and a plurality of p field limiting rings of a terminal area; and then, through the pre-deposition of impurity phosphor, forming a n+ cut-off ring and a n+ cathode area on the upper surface and the lower surface; and after a chip is completed, successively adopting low energy electron irradiation and highenergy hydrogen ion local irradiation on an anode side so as to acquire special minority carrier lifetime distribution. A high-voltage diode manufactured by using the method of the invention has a high breakdown voltage and a fast and soft reverse direction recovery characteristic, current concentration at the edge of an active area can be well alleviated, a dynamic avalanche resistance capabilityis increased, and high reliability is possessed.
Owner:RUNAU ELECTRONICS YANGZHOU MFG +1

A method for monitoring ion implantation doping concentration

The invention discloses a method for monitoring ion implantation doping concentration. The method comprises the following steps: fusing ion implantation operation into any half surface of an MOS structure substrate slice so that two sides of the surface of a test area are of different doping concentrations, further testing quasi-static C-V characteristic and high-frequency C-V characteristic on two sides, and calculating flat belt voltage difference values on two sides of the surface; under the same technological condition, carrying out a plurality of groups of parallel tests for different ionimplantation dosages so as to obtain a plurality of flat belt voltage difference values, wherein functional relationships between the flat belt voltage differences values and the ion implantation dosages can be matched in combination with the flat belt voltage difference values and corresponding ion implantation dosage data; according to the same technological process, carrying out ion implantation operation on an area D1 in one half of the substrate slice to be monitored and an area D2 in the other half of the substrate slice to be monitored to obtain corresponding flat belt voltage difference values delta VoFB, substituting the VoFB into the functional relationships between the flat belt voltage differences values and the ion implantation dosages so that the doping concentration of boron ions or phosphorus ions actually introduced into the substrate slice to be monitored through ion implantation can be solved determined.
Owner:西安西岳电子技术有限公司
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