The application relates to a dv / dt tolerance test circuit and method for a power device, which comprises a gate large-current
driving circuit and a main circuit; the main circuit comprises MOS3, a device to be tested, a driving
pulse generator V GS , a
capacitor C2, resistors R G and R4, and a high-
voltage direct-
current voltage source V2; the gate large-current
driving circuit is connected with the gate of MOS3, is used for controlling the fast turn-on and turn-off of MOS3, clamping the
gate voltage of MOS3 at a safe value, and adjusting the size of dv / dt of the main circuit; at the moment of the turn-on of MOS3, one end of the
capacitor C2 is forced to be grounded, so that the
voltage across the
capacitor C2 is rapidly applied to the device to be tested, and then a large dv / dt
pulse voltage is generated. The application has higher reliability, the size of the dv / dt
pulse voltage can be adjusted, the observation mode of indirect measurement has low precision requirement on the
test equipment, the cost of the
test equipment can be greatly reduced, and the
realizability is high.