7 results about "High energy electron beam" patented technology

The application relates to a method for realizing beam expansion and divergence angle compression by a quadrupole magnet and a solenoid, which is used for controlling high-energy electron beams generated by an accelerator, eliminating the influence of the Coulomb force of the electron beams and weakening the divergence angle of the electron beams. The method realizes electron beam expansion and primary compression of the divergence angle by four fixed permanent quadrupole magnetic rings and one electric quadrupole magnetic ring, and realizes ultimate compression of the beam divergence angle by one composite solenoid electromagnet. The electron beam radius is expanded from the millimeter level to the centimeter level in a very short distance, the influence of the Coulomb force is reduced by 1-2 orders of magnitude, and the increment of the divergence angle is controlled in the 0.01 mrad level. The initial divergence angle of the electron beam is compressed from the 1 mrad level to the 0.1 mrad level, and theoretically, the beam spot can be compressed from the meter level to the 10 cm level when the electron beam is transmitted for 1 km, so that the transmission distance of the electron beam is greatly increased.

The invention relates to the technical field of beam gates, and discloses a particle beam gate structure and a beam gate control device.The particle beam gate structure comprises a first polar plate group, a second polar plate group, a third polar plate group and a Faraday cage which are sequentially arranged; the first polar plate group is provided with a first electric field operation area for deflecting the electron beam; the second polar plate group is provided with a second electric field operation area and is used for reversely deflecting the electron beams passing through the first electric field operation area; the third polar plate group is provided with a first space and a third electric field operation area, the first space and the third electric field operation area are oppositely arranged, no electric field is arranged in the first space, and the third electric field operation area is used for deflecting a high-energy electron beam. The first polar plate group and the second polar plate group enable the low-energy electron beam to be incident to the Faraday cage after being subjected to two times of inclined deflection; the high-energy electron beam is incident to the Faraday cage after being deflected for three times, so that the problem that electron beams with different energies cannot be deflected by the beam brake under the same voltage in the existing design is effectively solved.

This utility model belongs to the field of electron beam irradiation sterilization technology, specifically relating to a high-energy electron beam irradiation sterilization device. It includes a sterilization chamber fixedly mounted on a support frame, a transfer roller rotatably connected to the support frame, and a transfer belt driven by the transfer roller. An adjustment opening structure is provided on the outer wall of the sterilization chamber. An electron beam generator is fixedly installed inside the sterilization chamber. A flipping mechanism, including an adjustment structure, is provided within the sterilization chamber. This high-energy electron beam irradiation sterilization device, through the cooperation of the flipping frame and the transfer belt, utilizes the inertia of the object to flip the frame, causing the bottom surface of a square object in contact with the transfer belt to flip upwards. This facilitates sterilization of the bottom of the object, solving the problem of sterilization dead zones caused by the bottom surface of the object contacting the transfer belt in traditional devices, achieving sterilization without dead zones and improving the sterilization effect.

We provide a secondary electron detector for atmospheric pressure electron microscopes. [Solution] The secondary electron detector 100 provided in an atmospheric pressure electron microscope is characterized in that secondary electrons generated when a high-energy electron beam is irradiated onto a sample are collected in a graphene ultrathin film, and when a voltage is applied between the graphene ultrathin film and the sample, ionization of the air or injected gas between the graphene ultrathin film and the sample occurs, which is greatly amplified by the avalanche effect, and the ion current is displayed as an image on a monitor through the amplifier.

This application relates to the field of food processing technology, specifically disclosing a high-energy electron beam-based irradiation sterilization and preservation process for fresh food. This process is applicable to the sterilization and preservation of fresh vegetables, fruits, cut foods, and prepared dishes, and consists of four core steps: raw material pretreatment, sealed packaging, high-energy electron beam irradiation treatment, and post-irradiation suitable preservation storage. Pretreatment removes impurities and controls moisture content in the raw materials; packaging uses a food-grade radiation-resistant composite film to form a sealed package; sterilization is achieved through electron beam irradiation; and finally, preservation storage is completed in an environment suitable for the characteristics of the food category. This process designs differentiated process parameters for different types of fresh food, achieving a synergistic effect of sterilization and preservation. It can effectively kill microorganisms while maintaining the inherent quality of fresh food, and the entire process uses physical treatment methods with no chemical residues. It is adaptable to various fresh food processing needs and is easily applied on an industrial scale.

The invention relates to the technical field of food preservation, provides an irradiation sterilization method for fruits, and solves the problems that the traditional irradiation technology easily causes deterioration of fruit quality, has a single preservation effect, lacks pertinence to different fruits, and is difficult to give consideration to sterilization and quality maintenance. Comprising the following steps: S1, selecting fresh target fruits without serious mechanical damage and pest and disease damage, selecting, cleaning, and grading according to variety, size and maturity; s2, the fruits treated in the step S1 are placed on a conveying belt, and irradiation treatment is conducted through high-energy electron beams generated by an electron accelerator; and S3, carrying out film coating treatment on the irradiated fruits, and then packaging and storing the fruits.

The present disclosure relates to a beam focusing transmission system applied to an ultra-high energy electron beam and a radiotherapy device, the system comprising: a transmission module and a focusing module, the quadrupole iron in the transmission module is used to diverge the incoming electron beam in the focusing exit direction and focus the incoming electron beam in the parallel exit direction; the deflection dipole iron in the transmission module is used to deflect the incoming electron beam by a specified angle in the parallel exit direction; the focusing module is used to focus the electron beam emitted by the transmission module in the focusing exit direction and diverge the electron beam emitted by the transmission module in the parallel exit direction, and different electrons in the electron beam emitted by the focusing module enter the target object at different positions and focus on the target region in the target object. According to the system of the embodiment of the present disclosure, the electron beam can be flattened and focused to increase the dose deposition peak depth in the target object, and the compactness of the whole beam focusing transmission system is improved.