The invention belongs to microelectronic technology and in particular to a tunable film bulk acoustic resonator (FBAR) comprising a substrate, a cavity, a bottom electrode layer, a tuning layer and apiezoelectric oscillation stack. The piezoelectric oscillation stack comprises an intermediate electrode layer, a piezoelectric layer, and a top electrode layer. A DC bias voltage is applied to the intermediate electrode layer and the bottom electrode layer. The FBAR DC bias voltage is applied to the bottom electrode and the intermediate electrode, the tuning layer has a piezoelectric characteristic, and the bottom electrode layer is in an annular shape. Thus, under a low DC bias voltage, the FBAR can produce a large offset displacement, resulting in a large change in characteristic frequency.Therefore, the large resonance frequency adjustment of the FBAR can be realized at a low voltage, thereby greatly expanding the application range of the FBAR.