The invention discloses a method for quickly screening and testing the cold resistance of tomatoes, which comprises: firstly, culturing tomato seedlings growing for 3 to 5 weeks, and processing stem apex leaves at 3 to 5 DEG C for 1 to 3 hours and at 3 DEG C below zero to 5 DEG C below zero for 7 to 9 hours; secondly, restoring the stem apex leaves at 3 to 5 DEG C for 10 to 14 hours and placing the stem apex leaves in light at 20 to 22 DEG C for 14 to 18 hours; and finally, measuring the electrical conductivity of the cold-treated and restored leaves, placing the leaves in distilled water, performing vacuumization and volume fixing, shaking the leaves at 21 to 23 DEG C under a sealed condition for 1 to 3 hours, measuring an electrical conductivity C1, sealing the leaves, boiling the leaves for 10 to 20 minutes, cooking the leaves to room temperature, measuring an electrical conductivity C2 and calculating a relative conductivity according to a formula of C=(C1-C0) / (C2-C0)x100, whereinwhen the value domain of the relative conductivity C is less than or equal to 42 percent, the tomato variety is a cold-resistance variety. In the invention, the cold resistance screening of the wholesystem is performed under controllable conditions, the result is reliable, the method is simple, convenient and easy to master, the breeding period is shortened greatly and the method can be used fortest the cold resistance of an introduced variety at the same time.