The invention discloses a method for epitaxial growth of a crack-free high-
crystal-quality LED epitaxial layer on a
metal gallium nitride composite substrate. The method comprises the steps of performing annealing treatment on the
metal GaN (
gallium nitride)
composite substrate firstly in an N<2>
atmosphere at a temperature of 750-850 DEG C at
reaction chamber pressure of less than 300
torr, and enabling a low-temperature GaN stress release layer with a thickness of 100-300 nanometers to be grown at a
low speed of 0.2-1.0 micron / h; then enabling a high-temperature non-doped GaN buffer layer with a thickness of 1-2 microns to be grown at a variable speed linearly changed from 1 micron / h to 3 micron / h in an H<2>
atmosphere at a temperature of 950-1,050 DEG C; next, enabling an n type GaN layer with a thickness of 1-2 microns to be grown at a constant
growth speed; then enabling a multi-period InGaN / GaN multi-
quantum-well active region to be grown in the N<2>
atmosphere at a temperature of 750-850 DEG C; and next, enabling a p type AlGaN / GaN
superlattice electron barrier layer and a p type GaN layer to be grown in the H<2> atmosphere at a temperature of 950-1,000 DEG C. According to the method, by optimizing parameters of carrier gas, growth temperature,
growth speed and the like in the initial growth period of the
metal substrate, thermal mismatch between the GaN epitaxial layer and the
metal substrate can be effectively relieved to prevent
decomposition of the GaN; and the high-quality GaN-based LED epitaxial layer is prepared on the
metal substrate.