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102 results about "Oxide passivation" patented technology

Oxide passivation. Passivation of a semiconductor surface by producing a layer of an insulating oxide on the surface.

Nanocarbide precipitation strengthened ultrahigh-strength, corrosion resistant, structural steels

A nanocarbide precipitation strengthened ultrahigh-strength, corrosion resistant, structural steel possesses a combination of strength and corrosion resistance comprising in combination, by weight, about: 0.1 to 0.3% carbon (C), 8 to 17% cobalt (Co), 0 to 10% nickel (Ni), 6 to 12% chromium (Cr), less than 1% silicon (Si), less than 0.5% manganese (Mn), and less than 0.15% copper (Cu), with additives selected from the group comprising about: less than 3% molybdenum (Mo), less than 0.3% niobium (Nb), less than 0.8% vanadium (V), less than 0.2% tantalum (Ta), less than 3% tungsten (W), and combinations thereof, with additional additives selected from the group comprising about: less than 0.2% titanium (Ti), less than 0.2% lanthanum (La) or other rare earth elements, less than 0.15% zirconium (Zr), less than 0.005% boron (B), and combinations thereof, impurities of less than about: 0.02% sulfur (S), 0.012% phosphorus (P), 0.015% oxygen (O) and 0.015% nitrogen (N), the remainder substantially iron (Fe), incidental elements and other impurities. The alloy is strengthened by nanometer scale M2C carbides within a fine lath martensite matrix from which enhanced chemical partitioning of Cr to the surface provides a stable oxide passivating film for corrosion resistance. The alloy, with a UTS in excess of 280 ksi, is useful for applications such as aircraft landing gear, machinery and tools used in hostile environments, and other applications wherein ultrahigh-strength, corrosion resistant, structural steel alloys are desired.
Owner:QUESTEK INNOVATIONS LLC

Nanocarbide precipitation strengthened ultrahigh strength, corrosion resistant, structural steels and method of making said steels

A nanocarbide precipitation strengthened ultrahigh-strength, corrosion resistant, structural steel possesses a combination of strength and corrosion resistance comprising in combination, by weight, about: 0.1 to 0.3% carbon (C), 8 to 17% cobalt (Co), 0 to 5% nickel (Ni), 6 to 12% chromium (Cr), less than 1% silicon (Si), less than 0.5% manganese (Mn), and less than 0.15% copper (Cu), with additives selected from the group comprising about: less than 3% molybdenum (Mo), less than 0.3% niobium (Nb), less than 0.8% vanadium (V), less than 0.2% tantalum (Ta), less than 3% tungsten (W), and combinations thereof, with additional additives selected from the group comprising about: less than 0.2% titanium (Ti), less than 0.2% lanthanum (La) or other rare earth elements, less than 0.15% zirconium (Zr), less than 0.005% boron (B), and combinations thereof, impurities of less than about: 0.02% sulfur (S), 0.012% phosphorus (P), 0.015% oxygen (O) and 0.015% nitrogen (N), the remainder substantially iron (Fe), incidental elements and other impurities. The alloy is strengthened by nanometer scale M2C carbides within a fine lath martensite matrix from which enhanced chemical partitioning of Cr to the surface provides a stable oxide passivating film for corrosion resistance. The alloy, with a UTS in excess of 280 ksi, is useful for applications such as aircraft landing gear, machinery and tools used in hostile environments, and other applications wherein ultrahigh-strength, corrosion resistant, structural steel alloys are desired.
Owner:QUESTEK INNOVATIONS LLC

Nanocarbide precipitation strengthened ultrahigh-strength, corrosion resistant, structural steels

A nanocarbide precipitation strengthened ultrahigh-strength, corrosion resistant, structural steel possesses a combination of strength and corrosion resistance comprising in combination, by weight, about: 0.1 to 0.3% carbon (C), 8 to 17% cobalt (Co), 0 to 10% nickel (Ni), 6 to 12% chromium (Cr), less than 1% silicon (Si), less than 0.5% manganese (Mn), and less than 0.15% copper (Cu), with additives selected from the group comprising about: less than 3% molybdenum (Mo), less than 0.3% niobium (Nb), less than 0.8% vanadium (V), less than 0.2% tantalum (Ta), less than 3% tungsten (W), and combinations thereof, with additional additives selected from the group comprising about: less than 0.2% titanium (Ti), less than 0.2% lanthanum (La) or other rare earth elements, less than 0.15% zirconium (Zr), less than 0.005% boron (B), and combinations thereof, impurities of less than about: 0.02% sulfur (S), 0.012% phosphorus (P), 0.015% oxygen (O) and 0.015% nitrogen (N), the remainder substantially iron (Fe), incidental elements and other impurities. The alloy is strengthened by nanometer scale MZC carbides within a fine lath martensite matrix from which enhanced chemical partitioning of Cr to the surface provides a stable oxide passivating film for corrosion resistance. The alloy, with a UTS in excess of 280 ksi, is useful for applications such as aircraft landing gear, machinery and tools used in hostile environments, and other applications wherein ultrahigh-strength, corrosion resistant, structural steel alloys are desired.
Owner:KUEHMANN CHARLES J +2

Fabrication method of P-type back-surface tunneling oxide passivation contact solar cell

The invention provides a fabrication method of a P-type back-surface tunneling oxide passivation contact solar cell. The method comprises the steps of performing previous process processing on a frontsurface and a back surface of a P-type single-crystal silicon wafer; oxidizing the back surface to form an ultrathin tunneling oxide layer and fabricate a boron-doping silicon thin film layer; performing phosphorus diffusion on the front surface of the single-crystal silicon wafer, and fabricating a selective emitter; and printing metal electrodes on surfaces of a first passivation anti-reflection layer on the back surface and a second passivation anti-reflection layer on the front surface of the single-crystal silicon wafer, and forming favorable contact between the metal electrodes and thesingle-crystal silicon wafer, thereby obtaining P-type back-surface tunneling oxide passivation contact of the solar cell. The invention provides a complete and practical P-type tunneling oxide passivation contact solar fabrication process circuit, a process method of first back-surface boron-doping poly-silicon thin film and then front-surface phosphorus diffusion, secondary phosphorus diffusioncan be effectively prevented, so that a phenomenon that square resistance is not matched is generated, and the operability is high.
Owner:SUZHOU TALESUN SOLAR TECH CO LTD

Passivation contact solar cell with selective emitter structure and preparation method of passivation contact solar cell

The invention relates to a passivation contact solar cell with a selective emitter structure and a preparation method of the passivation contact solar cell. The method comprises the following steps: (1) preparing texturing surfaces on two surfaces of an N-type crystalline silicon substrate; (2) performing boron diffusion treatment on the texturing surface of the front surface of the substrate to form a lightly doped region layer; (3) performing local boron ion implantation on the lightly doped region layer by using a mask, and annealing to form a local heavily doped region; (4) preparing a tunneling oxide layer on the texturing surface of the back surface of the substrate, and preparing a phosphorus-doped polycrystalline silicon layer on the tunneling oxide layer; (5) preparing a silicon nitride antireflection layer on the phosphorus-doped polycrystalline silicon layer; preparing an aluminum oxide passivation layer on the lightly doped region layer on the front surface of the substrate, and preparing a silicon nitride antireflection layer on the aluminum oxide passivation layer; and (6) carrying out silk-screen printing of metallized slurry on the two surfaces of the substrate, andsintering. According to the invention, the composite current on the surface of the emitter can be remarkably reduced, so that the efficiency of the N-type passivation contact battery can be improvedby more than 0.2%.
Owner:TAIZHOU ZHONGLAI PHOTOELECTRIC TECH CO LTD

P-type local back surface field passivation double-sided solar cell and preparation process thereof

The invention discloses a p-type local back surface field passivation double-sided solar cell and a preparation process thereof, and relates to the technical field of solar cells. The solar cell comprises a p-type silicon substrate, wherein the bottom of the p-type silicon substrate is provided with a silicon oxide passivation layer, an aluminum oxide passivation layer and a back silicon nitride antireflection layer from top to bottom, the bottom of the p-type silicon substrate is embedded with a plurality of strips of a boron source doped layer, and the bottom of the boron source doping layeris connected with a back metal electrode layer which simultaneously penetrates through the silicon oxide passivation layer, the aluminum oxide passivation layer and the back silicon nitride antireflection layer. During the preparation, a plurality of local slots are formed in the lower surface of the back silicon nitride antireflection layer by using laser, the local slots are formed to the bottom of the p-type silicon substrate, the slotted area is printed with boron source slurry to form a high-low junction structure, the open-circuit voltage of the back cell of the double-sided solar cellis improved, the slotted boron source slurry heavily-doped area is in contact with a metal electrode to form ohmic contact, the series resistance is reduced, the filling factor is improved, and the double-sided rate of the cell is improved under the condition of not reducing the front efficiency.
Owner:TONGWEI SOLAR ENERGY (CHENGDU) CO LID

N-type crystalline silicon two-sided battery and preparing method thereof

The invention discloses an N-type crystalline silicon two-sided battery and a preparing method thereof and belongs to the technical field of solar batteries. The N-type crystalline silicon two-sided battery comprises an N-type silicon substrate, a boron doping layer, an anode of the battery, an aluminum oxide passivation layer, silicon nitride antireflection layers, an ion implantation phosphor doping layer, a silicon nitride passivation and antireflection layer and a cathode of the battery. The invention further discloses the preparing method for the battery. The method specifically comprises the steps of (1) carrying out chemical cleaning; (2) adding a boron source; (3) injecting a phosphor source to the lower surface and carrying out annealing; (4) preparing the aluminum oxide passivation layer and the first silicon nitride antireflection layer on the upper surface; (5) preparing the second silicon nitride antireflection layer on the lower surface; (6) preparing the anode and the cathode of the battery; (7) carrying out sintering. According to the N-type crystalline silicon two-sided battery, the stability performance of the battery can be improved, absorption of short waves is reduced, blue ray response is improved, the short-circuit current density of the battery is improved, and the efficiency of the battery is improved; the method preparing the battery simplifies the manufacture procedure of the two-sided battery, and the battery has high practicality.
Owner:ALTUSVIA ENERGY TAICANG

Compound deoxygenation corrosion inhibitor for boiler water supply and preparation method thereof

InactiveCN107352610AAvoid corrosionOvercome the disadvantage of low oxygen removal efficiencySpecific water treatment objectivesWater/sewage treatment by degassingLiquid productBoiler blowdown
The invention provides a compound deoxygenation corrosion inhibitor for boiler water supply. The deoxygenation corrosion inhibitor includes a variety of organic components, all the components cooperate and can achieve rapid and effective removal of dissolved oxygen from boiler water, and overcome the shortcoming of low deoxygenation efficiency of single deoxidant. The deoxygenation corrosion inhibitor obtained by adjusting the organic alkalizer content can be applied to ordinary pressure, medium-pressure and high-pressure boilers, and has wide application range. Oxime and hydrazide have strong reducibility, can quickly remove dissolved oxygen from boiler water, and at the same time can generate a layer of dense black ferroferric oxide passivation film on the boiler inner wall so as to prevent further corrosion of the boiler. The deoxygenation corrosion inhibitor provided by the invention has no need for ammonia water to serve as the pH regulator, and avoids ammonia corrosion. The deoxygenation corrosion inhibitor provided by the invention is composed of all-organic components, does not introduce inorganic impurities or reaction by-products, does not affect the boiler blowdown and steam quality, and is a liquid product, and has the advantages of no toxicity, no flash point, and safe and convenient use and operation.
Owner:SHENYANG DREAMLAND ENVIRONMENTS TECH

High-reliability PERC back silver conductive paste for crystalline silicon solar cell and preparation process for high-reliability PERC back silver conductive paste

The invention discloses high-reliability PERC back silver conductive paste for a crystalline silicon solar cell and a preparation process for the high-reliability PERC back silver conductive paste. The viscosity of the slurry is 20 to 80 Pa.S, and the paste contains the following components in percentage by mass: 0.1%-0.3% of an inorganic additive, 1%-5% of glass powder, 45%-65% of silver powder,2%-6% of ethyl cellulose, 1%-5% of terpilenol, 20%-35% of texanol ester alcohol and a proper amount of an organic additive, wherein the glass powder is formed by the mixing of glass powder I and glasspowder II. The preparation method comprises the following steps: uniformly mixing the organic additive, ethyl cellulose, terpilenol and texanol ester alcohol under the water bath condition to obtaina carrier; adding the mixed glass system and the inorganic additive into the carrier, and uniformly mixing the mixture; and adding the silver powder system into the system at the step 2, and performing uniform mixing, rolling and filtering to obtain the back conductive silver paste. According to the invention, the PERC back silver paste guarantees the characteristics of the traditional non-contactsilver paste, is fewer in damages to an aluminum oxide passivation layer, is high in welding reliability of a back silver paste sintered electrode due to the fact that a mixed glass system is adopted, and has excellent comprehensive performances under the condition that the actual temperature is 740 DEG C-780 DEG C.
Owner:ZHEJIANG GUANGDA ELECTRONICS TECH

Enhanced transistor based on III oxide passivation and manufacturing method of enhanced transistor

The invention discloses an enhanced transistor based on III oxide passivation and a manufacturing method of the enhanced transistor. The manufacturing method comprises the steps of growing and forminga heterojunction on a substrate, wherein the heterojunction comprises a first semiconductor and a second semiconductor formed on the first semiconductor, the second semiconductor has a band gap whichis wider than the first semiconductor, and two-dimensional electron gas is formed in the heterojunction; forming a cap layer on the second semiconductor, wherein the cap layer comprises a doping region and passivation regions, and the doping region is composed of a third semiconductor and is completely covered by the gate, the passivation regions are distributed between the gate and the drain andbetween the gate and the source, and the third semiconductor is used for exhausting the two-dimensional electron gas distributed in a gate lower region in the heterojunction; and making the source, the drain and the gate. According to the enhanced transistor disclosed by the invention, the uniformity, repeatability and introduction damage problems caused by etching the P-type doping region can beavoided, and the device reliability problem caused by the fact that a high-resistance layer formed by hydrogen plasma passivation is possibly re-activated at a high temperature can be avoided.
Owner:SUZHOU INST OF NANO TECH & NANO BIONICS CHINESE ACEDEMY OF SCI

Neodymium-iron-boron magnet surface composite corrosion-resistant coating and preparation method thereof

The invention discloses a neodymium-iron-boron magnet surface composite corrosion-resistant coating and a preparation method thereof. The composite corrosion-resistant coating sequentially comprises acold spraying aluminum coating, an aluminum oxide passivation layer obtained through surface passivation treatment and a hole sealing ceramic paint layer from the surface of a neodymium-iron-boron magnet to the outside. The preparation method comprises the following steps of: (1) surface treatment of a neodymium-iron-boron substrate; (2) treatment of aluminum powder; (3) cold spraying of an aluminum coating; (4) passivation treatment to obtain an aluminum oxide passivation layer; and (5) hole sealing treatment to obtain a hole sealing ceramic paint layer. The prepared neodymium-iron-boron magnet surface composite corrosion-resistant coating has excellent local corrosion resistance, the corrosion-resistant coating is formed by well combining with the neodymium-iron-boron magnet, the defects that a pure aluminum coating is low in strength and hardness and micropores exist in the surface are overcome, and the service life of the corrosion-resistant coating is prolonged when the corrosion-resistant coating is used as a sintered neodymium-iron-boron magnetic material surface corrosion-resistant process.
Owner:INNER MONGOLIA UNIV OF TECH

P-type tunneling oxide passivation contact solar cell and preparation method thereof

PendingCN110690297AImprove interface passivation effectReduce composite speedFinal product manufacturePhotovoltaic energy generationHeterojunctionSolar battery
The invention discloses a P-type tunneling oxide passivation contact solar cell. The P-type tunneling oxide passivation contact solar cell comprises P-type silicon, an N-type heavily doped silicon layer and a front SiNx antireflection layer are sequentially deposited on the front surface of the P-type silicon from inside to outside, a silicon dioxide layer and an N-type heavily doped polycrystalline silicon layer which are in contact with each other are arranged in the N-type heavily doped silicon layer, the silicon dioxide layer is arranged on one side close to the P-type silicon, an Ag gatefinger electrode is arranged in the front SiNx antireflection layer, and the Ag gate finger electrode and the N-type heavily doped polycrystalline silicon layer correspond to each other and form ohmiccontact; and an aluminum oxide layer and a back SiNx antireflection layer are sequentially deposited on the back surface of the P-type silicon from inside to outside. The TOPCon solar cell structureprepared by the invention can combine the advantages of an existing heterojunction structure and a traditional polycrystalline silicon junction structure, namely, has high carrier selectivity, high temperature stability and excellent interface passivation effect, so that the solar cell with high conversion efficiency and high stability is achieved.
Owner:TONGWEI SOLAR (ANHUI) CO LTD +1

Front grid line passivation contact-based PERC solar cell and preparation method thereof

The invention belongs to the technical field of crystalline silicon solar cells, and relates to a front grid line passivation contact-basedPERC solar cell and a preparation method thereof. The solar cell comprises a P type monocrystalline silicon substrate; a back aluminum oxide passivation layer and a back silicon nitride passivation layer are sequentially arranged on the back surface of the P type monocrystalline silicon substrate from inside to outside. A front silicon oxide passivation layer and a front silicon nitride passivation layer are sequentially arranged on the front face of the Ptype monocrystalline silicon substrate from inside to outside; a front metal silver grid line penetrating through the front silicon oxide passivation layer and the front silicon nitride passivation layer is arranged on the front face of the P type monocrystalline silicon substrate. An ultrathin tunneling silicon oxide layer and a phosphorus-doped polycrystalline silicon layer are sequentially arranged on the front face of the P type monocrystalline silicon substrate and located below the front face metal silver grid line from inside to outside. According to the solar cell and preparation method thereof of the invention, the open-circuit voltage of the cell can be improved, the carrier recombination of a metal contact region can be reduced, the parasitic absorption of the doped polycrystalline silicon layer to light can be reduced, the current loss can be reduced, and the efficiency of the PERC cell can be improved.
Owner:TRINA SOLAR CO LTD +1

An N-type crystalline silicon solar cell based on doped polysilicon germanium thin film and a preparation method thereof

The invention relates to an N-type crystalline silicon solar cell based on doped polycrystalline silicon germanium thin film and a preparation method thereof, wherein the N-type crystalline silicon wafer is velvet on both sides, Double-sided boron is then diffuse on that front surface to form an emitter, An oxide tunneling layer is prepared by alkali throwing on the back surface, Then N + polysilicon germanium thin films were prepared by reactive thermal CVD at low temperature below 350oC to form back tunneling oxide passivation contact structure. Then emitter passivation film and front and back antireflection film were prepared. Finally metal gate line electrodes were prepared in front and back of the cell. A low-temperature process is adopted to prepare that N + polycrystalline silicon germanium film on the back surface of the invention, which not only avoid the damage of the tunneling oxide layer caused by the high-temperature process, but also can obtain the polycrystalline silicongermanium film with higher crystalline quality, effectively improve the doping concentration and the carrier mobility of the film, and is beneficial to improving the filling factor and the conversionefficiency of the battery.
Owner:JIANGSU SHUNFENG PHOTOVOLTAIC TECH CO LTD

P-type crystalline silicon solar cell with tunneling passivation and preparation method thereof

The invention belongs to the technical field of crystalline silicon solar cells, and relates to a P-type crystalline silicon solar cell with tunneling passivation and a preparation method thereof. Thesolar cell comprises a P-type substrate, and is characterized in that a selective emitter, an ultrathin tunneling silicon oxide layer, a phosphorus-doped polycrystalline silicon layer, a front silicon oxide passivation layer and a front silicon nitride passivation layer are sequentially arranged on the front face of the P-type substrate from inside to outside, and a back aluminum oxide passivation layer and a back silicon nitride silicification layer are sequentially arranged on the back face of the P-type substrate from inside to outside; A front metal silver grid line is arranged on the front silicon nitride passivation layer, a back metal aluminum grid line is arranged on the back face of the P-type substrate, and the back metal aluminum grid line penetrates through the back aluminum oxide passivation layer and the back silicon nitride silicification layer. The structure is very thin, the problem of light absorption of the silicon wafer is solved, the surface recombination rate ofthe cell is effectively reduced, the front passivation of the cell is improved, and the performance of the cell is improved.
Owner:TRINA SOLAR CO LTD +1

Atomic layer etching 3D structures: si and sige and ge smoothness on horizontal and vertical surfaces

The invention relates to atomic layer etching 3D structures: SI and SiGe and Ge smoothing on horizontal and vertical surfaces. Methods and apparatuses for etching semiconductor material on substrates using atomic layer etching by chemisorption, by deposition, or by both chemisorption and deposition mechanisms in combination with oxide passivation are described herein. Methods involving atomic layer etching using a chemisorption mechanism involve exposing the semiconductor material to chlorine to chemisorb chlorine onto the substrate surface and exposing the modified surface to argon to remove the modified surface. Methods involving atomic layer etching using a deposition mechanism involve exposing the semiconductor material to a sulfur-containing gas and hydrogen to deposit and thereby modify the substrate surface and removing the modified surface.
Owner:LAM RES CORP
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