9 results about "Sem analysis" patented technology

The invention relates to a quantitative evaluation method for the occurrence state of rhenium in sandstone-type uranium deposit, and the method comprises the steps: providing a to-be-evaluated sandstone-type uranium deposit, and making a sample wafer; analyzing the types and distribution conditions of minerals on the surface of the sample; carrying out EDS-SEM analysis on the sample wafer, outputting a back scattering image, further analyzing the mineral type and distribution condition on the surface of the sample wafer through the back scattering image, carrying out energy spectrum analysis on a bright white region in the back scattering image, obtaining the Re element content, and setting a region with the Re element content higher than 0.1% as a marked region; performing surface scanning energy spectrum analysis on the sample wafer to obtain an element spectrum diagram, and obtaining an Re element enrichment region; and quantitatively evaluating the occurrence state of rhenium according to the analyzed information. According to the method, firstly, the mineral type and the distribution condition of the surface of the uranium ore sample are analyzed, then the distribution condition of the Re element on the surface of the sample is analyzed, and the occurrence states of the Re element in different minerals can be known by comparing the two kinds of information one by one.

The invention relates to a rapid pretreatment method for an electron microscope sample. The rapid pretreatment method comprises the steps of S1, surface cleaning, S2, embedding, S3, grinding and polishing, S4, chemical etching, S5, conductive treatment and S6, SEM analysis. Compared with FIB ion treatment, the method has the advantages that the sample preparation process is more controllable, the extension part of the silver layer can be removed by chemical erosion besides grinding and polishing, the damage to the film layer structure can be effectively reduced, the cost is low, the operation is simple and convenient, the repeatability is good, and powerful support is provided for SEM analysis of the film layer of the film coating sample.

A scanning electron microscope (SEM) cross-sectional sample preparation method for thin film materials based on a laser-heat-broken brittle substrate, belonging to the field of thin film materials, includes: fabricating the thin film to be tested on a brittle substrate; dispersing light-absorbing nanoparticles in an organic solvent to prepare an ink, followed by ultrasonic dispersion, with the dispersion temperature controlled by a water bath; filtering the dispersed ink to obtain ITO nanoparticle ink; setting a driving waveform to obtain ITO droplets; heating the brittle substrate on which the thin film to be tested has been prepared; setting printing parameters and printing patterns to start inkjet printing to obtain light-absorbing material lines; heating the brittle substrate on which the thin film to be tested and the light-absorbing material lines have been prepared; adjusting the laser spot diameter and laser parameters, setting the laser scanning path, and starting the laser to perform sintering treatment to achieve fracture of the brittle substrate; and performing SEM analysis on the fractured substrate. This invention has the advantages of simple operation, smooth fracture surface, high sample preparation efficiency, wide applicability, low cost, and repeatability.

The invention relates to a sandstone porosity prediction method based on sedimentary action and diagenesis, which comprises the following steps: acquiring a core plug sample, a polished slice sample, a sandstone core debris sample and a sandstone slice sample from a drill hole of a target basin, and predicting the distribution of the abnormally high porosity of the target basin by using the porosity and permeability of the core plug sample, the clastic components of the polished slice sample, the volume content of diagenesis minerals and slice porosity, an SEM analysis result, the mineral components and granularity of the sandstone core clastic sample and the homogenization temperature. According to the method, a complete multi-dimensional analysis system is formed by combining a plurality of data sources. Compared with a traditional prediction method which only depends on single test data, the method integrates multiple technical means, can comprehensively reflect the influence of deposition and diagenesis on porosity evolution, and provides more accurate porosity prediction.

Converged ion beam polishing system using radio frequency based gridded ion source and applications thereof The present invention discloses a dual-source broad ion beam polishing system designed for high-precision surface and cross-section milling It features an ion milling chamber (01) and load lock chamber (02) connected via a transfer arm (03). Two inductively coupled plasma ion sources with gridded extraction are mounted on flanges (04): an EBSD ion source (05a) for flat milling and a cross-section ion source (05b) for cross-sectional polishing, each with dedicated specimen holders (09a, 09b) and adjustable ion incidence. The cross-section source includes a conical aperture (12) to produce a 3 mm collimated beam for high-resolution thinning. Dielectric plasma chambers (06), inductive coils (07), and focusing grids (08) ensure stable ion generation. Shutters (11a, 11b) serve as Faraday devices. Real-time monitoring is provided by an integrated CMOS camera. The system enables efficient, artifact-free sample preparation for EBSD and SEM analysis across fields like metallurgy, semiconductors, materials science, and geology.

The invention belongs to the technical field of preparation of electronic information functional materials, and discloses ultralow-dielectric-loss low-dielectric rare earth oxide microwave dielectric ceramic and a preparation method thereof, and the chemical expression is Y < 2-x > Sm < x > O < 3 >, wherein x is more than or equal to 0.35 and less than or equal to 0.45 Y2O3 and Sm2O3 are used as raw materials, the rare earth oxide microwave dielectric ceramic is obtained through a one-step sintering method, the dielectric constant epsilon r is 11.5-12.5, the dielectric loss tan delta is 8.1 E-5-7.4 E-5, and the temperature coefficient of resonance frequency tau f is-46 ppm / DEG C to-44 ppm / DEG C. By adjusting the content of Sm2O3 in the Y2O3 ceramic, the prepared Y2O3-based microwave dielectric ceramic maintains the cubic single-phase structure of the Y2O3 ceramic, SEM analysis shows that the prepared ceramic is highly compact, EDS analysis shows that elements are uniformly distributed, the purposes of low dielectric constant and ultralow dielectric loss are achieved in performance, and the reason of ultralow dielectric loss is higher conductivity activation energy Ea.

The invention provides a method for enhancing image contrast of a color filter film in a photosensitive element, which mainly utilizes the characteristic that the material of the RGB color filter film reacts with X-ray or ultraviolet light, and utilizes the qualitative change of the color filter film after the irradiation of the X-ray or ultraviolet light, so that the color filter films of different RGB dyes can be clearly distinguished during SEM (scanning electron microscope) observation. According to the invention, the color filter films of different RGB dyes can be clearly distinguished during SEM observation by utilizing the characteristic that the material of the RGB color filter film reacts with X-rays or ultraviolet light and the qualitative change generated after the color filter film is irradiated by the X-rays or the ultraviolet light. According to the method, the SEM analysis quality in material analysis is effectively improved, the comparison of different color filter film materials on an SEM image is increased in actual use, although the color filter film materials are subjected to qualitative change, the morphology of the color filter film materials is not influenced, and the analysis result is not influenced.

The application discloses a monoclinic phase BiVO4 micropipe prepared by a microwave radiation method and a preparation method thereof. Pure Bi(NO3)3.5H2O and NH4VO3 are used as reaction raw materials, distilled water is used as a solvent, polyethylene glycol (PEG-10000) with a molecular weight of 10000 is used as a surfactant, and a monoclinic phase BiVO4 micropipe material is prepared by using a microwave radiation technology. The microwave radiation process is simple in operation, energy-saving and environment-friendly, low in energy consumption, and energy-concentrated, and is favorable for improving a reaction rate and a synthesis efficiency of the BiVO4 material. The XRD and SEM analysis results of the product fully prove that the method can obtain the BiVO4 material with regular morphology and small particle size, is favorable for increasing active sites of the BiVO4 material, and thus improves the photocatalytic performance of the BiVO4 material. The target product BiVO4 material has the abilities of catalytic degradation of pollutants, catalytic photoelectrochemical decomposition of water and energy storage, and is expected to play an important role in the field of photocatalysis.

The invention discloses a cold work die steel three-point bending fatigue life prediction method based on the subsurface carbide size, which comprises the following steps: carrying out a three-point bending fatigue test on a cold work die steel sample, and analyzing a fatigue fracture to obtain a subsurface carbide size parameter; calculating a stress intensity factor based on the stress amplitude and a subsurface carbide size parameter; and constructing a fatigue life prediction formula, and predicting the three-point bending fatigue life of the cold work die steel by combining the stress intensity factor. According to the method, the stress intensity factor is introduced, the external stress amplitude and the subsurface carbide size are coupled, the stress concentration effect is quantified, the explicit relation with the fatigue life is established, and the cycle index is directly predicted. A scanning electron microscope and an energy scattering spectrum are combined to optimize model parameters, and fisheye morphology fracture is accurately predicted; only a three-point bending test and SEM analysis are needed, the process is simplified, the cost is reduced, the prediction precision is improved, and the engineering applicability is enhanced.