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1 results about "Sem analysis" patented technology

SEM Analysis with EDS Capabilities. Scanning Electron Microscopy (SEM) is a test process that scans a sample with an electron beam to produce a magnified image for analysis. The method is also known as SEM analysis and SEM microscopy, and is used very effectively in microanalysis and failure analysis of solid inorganic materials.

A monoclinic phase BiVO4 microtube prepared by microwave radiation and its preparation method

ActiveCN116177599BVanadium compoundsMetal/metal-oxides/metal-hydroxide catalystsSolvent moleculeActive agent
The application discloses a monoclinic phase BiVO4 micropipe prepared by a microwave radiation method and a preparation method thereof. Pure Bi(NO3)3.5H2O and NH4VO3 are used as reaction raw materials, distilled water is used as a solvent, polyethylene glycol (PEG-10000) with a molecular weight of 10000 is used as a surfactant, and a monoclinic phase BiVO4 micropipe material is prepared by using a microwave radiation technology. The microwave radiation process is simple in operation, energy-saving and environment-friendly, low in energy consumption, and energy-concentrated, and is favorable for improving a reaction rate and a synthesis efficiency of the BiVO4 material. The XRD and SEM analysis results of the product fully prove that the method can obtain the BiVO4 material with regular morphology and small particle size, is favorable for increasing active sites of the BiVO4 material, and thus improves the photocatalytic performance of the BiVO4 material. The target product BiVO4 material has the abilities of catalytic degradation of pollutants, catalytic photoelectrochemical decomposition of water and energy storage, and is expected to play an important role in the field of photocatalysis.
Owner:XIJING UNIV