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55results about How to "Improve interface features" patented technology

Organic/inorganic composite porous isolating membrane, preparation method thereof and electrochemical device

The invention provides an organic / inorganic composite porous isolating membrane, a preparation method thereof and an electrochemical device. According to the first aspect of the invention, the organic / inorganic composite porous isolating membrane comprises a porous base material and an organic / inorganic composite porous coating coated on at least one surface of the porous base material, wherein the organic / inorganic composite porous coating comprises inorganic particles, a binding agent and organic particles with at least two swelling degrees, and the organic particles are swelled by a plasticizer. The preparation method of the organic / inorganic composite porous isolating membrane is used for preparing the organic / inorganic composite porous isolating membrane described in the first aspect of the invention. According to the third aspect of the invention, the electrochemical device comprises the organic / inorganic composite porous isolating membrane described in the first aspect of the invention. Therefore, the organic / inorganic composite porous isolating membrane can form an excellent interface, so that a risk that the risk of blocking holes by the organic particles is reduced, breathability of the organic / inorganic composite porous isolating membrane is improved, and electrical conductivity of the organic / inorganic composite porous isolating membrane is improved.
Owner:DONGGUAN AMPEREX TECH +1

High-plasticity quasi-mesh-shaped structure titanium-based composite material and preparation method thereof

The invention discloses a high-plasticity quasi-mesh-shaped structure titanium-based composite material. Titanium or a titanium alloy is used as a substrate, the TiC phase synthesized on the Ti substrate in situ and TiC@graphene synthesized on the Ti substrate in situ are used as enhancement bodies, the enhancement bodies are evenly and discontinuously distributed at the position of the original beta grain boundary of the Ti substrate, and a quasi-mesh-shaped structure is formed. The invention further discloses a preparation method of the high-plasticity quasi-mesh-shaped structure titanium-based composite material. According to the method, titanium-based spherical powder particles with rough surfaces are added in a graphene nanosheet suspension solution, mixed powder is prepared, and spark plasma sintering is conducted. By means of distribution states and structures of the enhancement bodies, namely, the TiC phase and the TiC@graphene, in the titanium-based composite material, the enhancement phase surrounded substrate is obtained, strength of the titanium-based composite material is improved, and extension plasticity of the titanium-based composite material is ensured. Accordingto the high-plasticity quasi-mesh-shaped structure titanium-based composite material, by conducting titanium-based powder surface pretreatment and wet method material mixing, the blending degree of the graphene and the titanium substrate is increased, and the defect that the room temperature deformation capacity and extension plasticity of the graphene titanium-based composite material are poor isovercome.
Owner:NORTHWEST INSTITUTE FOR NON-FERROUS METAL RESEARCH

Preparation methods of SiC device gate dielectric layer and SiC device structure

The invention provides preparation methods of a SiC device gate dielectric layer and a SiC device structure. The preparation method of a gate dielectric layer includes the following steps: providing a SiC substrate, and placing the SiC substrate in an ALD reaction chamber; heating the ALD reaction chamber to a temperature suitable for the growth of a gate dielectric layer to be formed subsequently; and forming a gate dielectric layer on the surface of the SiC substrate through an ALD process. According to the technical scheme, Si atoms in a SiC epitaxial wafer are not consumed in the growth process of the gate dielectric layer, so that the phenomenon of C group aggregation at the interface of a gate dielectric film and SiC is avoided, and the interface property is improved. The gate dielectric layer is formed through an ALD technology, the thermal budget is low, and the device preparation process is simplified. The gate dielectric layer formed through the ALD technology has the advantages of high critical breakdown strength, low leakage and high dielectric constant. The strength of electric field introduced to the gate dielectric film can be greatly reduced, and breakdown of the gate dielectric can be avoided.
Owner:SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI

N-Ge-i-Ge-p-Si structural waveguide-type photoelectric detector based on LRC technology and manufacturing method

The invention relates to an n-Ge-i-Ge-p-Si structural waveguide-type photoelectric detector based on an LRC technology and a manufacturing method. The method comprises the following steps of manufacturing a SOI substrate; etching and forming a waveguide area, a coupling structure and a device poriton on a top layer Si layer surface respectively; growing a Ge material on a surface of the device portion and manufacturing a protection layer; heating a whole substrate, using a laser technology to crystallize the whole substrate, cooling and making the Ge material form a crystallization Ge layer, and removing the protection layer; growing a first Ge layer and a second Ge layer on a crystallization Ge layer surface; manufacturing a passivation layer on the whole substrate, using a selective etching technology to etch the passivation layer so as to form a P-type contact hole on the top layer Si layer surface and an N-type contact hole on a second Ge layer surface; and depositing metal in theP-type and N-type contact holes and completing interconnection so as to finally form the photoelectric detector. In the invention, by using the photoelectric detector, dark currents can be reduced, aconflict of a high speed response and quantum efficiency in a vertical light-entering-type optical detector is overcome, simultaneously a high speed and high quantum efficiency are guaranteed.
Owner:TIBET UNIVERSITY FOR NATIONALITIES

Nitride semiconductor structure and semiconductor light-emitting component

ActiveCN103972345AImprove the problem of quality deteriorationReduce compressive stressSemiconductor devicesQuantum wellDegradation Problem
The invention relates to a nitride semiconductor structure and a semiconductor light-emitting component. The nitride semiconductor structure is mainly characterized in that a stress control layer is arranged between a light-emitting layer and a p-type carrier barrier layer, the p-type carrier barrier layer is made of materials expressed by AlxGa1-xN, the x is larger than zero and smaller than one, the stress control layer is made of materials expressed by AlxInyGa1-x-yN, the x is larger than zero and smaller than one, the y is larger than zero and smaller than one, a sum of the x and the y is larger than zero and smaller than one, the light-emitting layer is of a multi-quantum-well structure formed by a plurality of alternated and stacked well layers and barrier layers, and one well layer is arranged between every two barrier layers. The semiconductor light-emitting component at least comprises the nitride semiconductor structure, an n-type electrode and a p-type electrode, and the n-type electrode and the p-type electrode supply power energy in a matched mode. In this way, the crystalline quality degradation problem, caused by lattice mismatching, of the p-type carrier barrier layer and the light-emitting layer can be solved through the stress control layer; meanwhile, compression stress caused by material differences and borne by the well layers can be reduced.
Owner:GENESIS PHOTONICS

Multi-epitaxy super junction power MOSFET structure and use method

The invention discloses a multi-epitaxy super junction power MOSFET structure and a use method, and relates to the technical field of semiconductor field effect transistors. The multi-epitaxy super junction power MOSFET structure comprises an N-type substrate and a shell, the substrate is arranged in the shell, and the top end of the N-type substrate is fixedly connected with a first epitaxial layer; the top end of the first epitaxial layer is fixedly connected with a second epitaxial layer, two grooves are formed in the top end of the first epitaxial layer, and two through grooves are formed in the middle of the second epitaxial layer. According to the present invention, the N-type substrate is arranged, the first epitaxial layer is formed on the surface of the N-type substrate by means of an epitaxial process, the top end of the first epitaxial layer is etched to form the two grooves, a gate oxide layer is formed in the middle of the surface of the second epitaxial layer, and a polycrystalline silicon grid electrode is formed on the surface of the gate oxide layer, so that the design of double-layer epitaxy or even multi-layer epitaxy can be realized, the breakdown voltage and performance of an MOSFET can be greatly improved, the ideal resistivity matching exists between two layers or multiple layers, and the interface characteristics of the multiple stacked epitaxial layers can be improved.
Owner:厦门芯一代集成电路有限公司

Method of preparing silicon carbide MOSFET gate dielectric layer

The invention provides a method of preparing a silicon carbide MOSFET gate dielectric layer. The method comprises the following steps of: providing a SiC substrate, and placing the SiC substrate in anALD reaction chamber, raising the temperature of the ALD reaction chamber, sequentially and circularly growing a SiO2 film and an Al2O3 film on the surface of the SiC substrate by adopting an ALD process to form a gate dielectric layer, and performing annealing processing on the formed gate dielectric layer in an oxygen atmosphere. In the growth process of the gate dielectric layer, Si atoms in the SiC epitaxial wafer are not consumed, so that the phenomenon of C group aggregation at the interface of the gate dielectric layer and SiC is avoided, and the interface characteristic is improved; the gate dielectric layer is formed by using the ALD technology, the thermal budget is low, and the device preparation process is simplified; the gate dielectric layer formed by the ALD technology hasthe characteristics of high SiO2 breakdown strength, wide forbidden band width, high thermal stability and high Al2O3 dielectric constant at the same time, the electric field intensity introduced intothe gate dielectric film can be greatly reduced, gate dielectric breakdown is avoided, and gate leakage current is inhibited.
Owner:NO 55 INST CHINA ELECTRONIC SCI & TECHNOLOGYGROUP CO LTD

NPN type transverse GaN/SiGe HBT device structure and manufacturing method thereof

The invention provides an NPN type transverse GaN/SiGe HBT device structure. The structure comprises a sapphire substrate, wherein a SiON oxide layer is formed on a surface of the sapphire substrate;an emitter region, a base region and a collector region which have the same thickness and different widths are formed on the surface of the SiON oxide layer from left to right; N-type doped GaN layersare deposited in the emitter region and the collector region; a P-type doped Si1-rGer layer of which a Ge component is gradually increased from left to right grows in the base region, and r is greater than 0 and less than 1; and electrode leading-out layers of an emitting electrode, a base electrode and a collecting electrode correspondingly grow on the surfaces of the emitting region, the base region and the collector region, all the electrodes are made of the same metal silicide, and the adjacent electrode regions are insulated and isolated through isolation oxide layers. The invention further provides a manufacturing method of the device structure. In the invention, an interface characteristic of a GaN layer and a SiGe layer can be improved, electron mobility of the base region is improved, transition time of the base region is reduced, a frequency of the device is improved, frequency characteristics are more excellent, and meanwhile, a switching speed and a cut-off frequency of the device can be improved by utilizing a metal silicide layer.
Owner:中合博芯(重庆)半导体有限公司

A kind of highly plastic quasi-network structure titanium-based composite material and its preparation method

The invention discloses a titanium-based composite material with a high-plasticity quasi-network structure, which uses titanium or titanium alloy as a matrix, uses graphene and Ti matrix in-situ self-generated TiC phase, TiC@graphene as a reinforcement, and the reinforcement is uniform and It is discontinuously distributed at the original β grain boundary of the Ti matrix to form a quasi-network structure; the invention also discloses a preparation method of a high-plasticity quasi-network structure titanium-based composite material, which uses rough-surfaced titanium-based spherical The powder particles are added to the suspension solution of graphene nanosheets to prepare mixed powder, and then spark plasma sintering is carried out. The distribution state and structure of the TiC phase and TiC@graphene reinforcement in the titanium-based composite material of the present invention realize that the strengthening phase surrounds the matrix, which improves the strength of the titanium-based composite material and ensures its extensional plasticity; Pretreatment and wet mixing increase the mixing degree of graphene and titanium matrix, and overcome the shortcomings of poor room temperature deformation ability and poor ductility of graphene titanium matrix composites.
Owner:NORTHWEST INSTITUTE FOR NON-FERROUS METAL RESEARCH

Lithium negative electrode coated with LiF film as well as preparation method and application of lithium negative electrode

The invention belongs to the technical field of lithium metal interface modification, and discloses a lithium negative electrode coated with a LiF film as well as a preparation method and applicationof the lithium negative electrode. The lithium negative electrode coated with the LiF film is prepared by the following steps: dissolving a fluorinating agent in a polar aprotic organic solvent, and preheating at 25-300 DEG C in an inert atmosphere under a sealed condition to prepare a fluorinating agent solution; putting the polished lithium sheet into a fluorinating agent solution, and reactingat 25-300 DEG C in an inert atmosphere; and cleaning with an organic solution, and drying at 50-150 DEG C to obtain the product. The fluorinating agent is used for fluorinating the lithium negative electrode, the LiF film is generated on the surface of the lithium negative electrode in situ, surface impurities are removed by the organic solvent after the reaction is finished to obtain the compactlithium negative electrode coated with the LiF film, and the LiF film effectively improves the interface characteristic of the lithium negative electrode, and inhibits the generation of lithium dendrites. And the coulombic efficiency and the cycling stability of the lithium negative electrode in the charging and discharging process are improved.
Owner:GUANGDONG UNIV OF TECH

Nylon 66 composite material for connecting rod sleeve and preparation method thereof

The invention discloses a nylon 66 composite material for a connecting rod sleeve. The nylon 66 composite material is prepared from raw material components such as a PA66 base material, carbon fiber,an interfacial compatibilizer, a dispersant, a chain extender, carbon black, an anti-wear agent and an additive; the obtained nylon 66 composite material is light in specific weight, has very strong designability, not only is easy to mould, but also is uniform in material after moulding, and has various significantly improved properties in lubricity, wear resistance, impact resistance, high temperature resistance, corrosion resistance, ageing resistance and the like. In addition, by a preparation method of the nylon 66 composite material, provided by the invention, the raw material mixing sequence is clarified, and especially after the carbon fiber is mixed with the specific interfacial compatibilizer and the matching dispersant in a dry state, melt extrusion is performed through a single-screw extruder and then feeding is performed through a side feed port, so that processing damage such as surface burring and easy tearing and layering due to addition of the carbon fiber is solved, performance advantages of the carbon fiber are fully played, the preparation limitation is broken through, and thus the high strength and the high performance of the nylon 66 composite material are guaranteed.
Owner:烟台恒大聚合体有限公司
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