136 results about "Specific substrate" patented technology

The invention relates to a preparation method of a metal probe applicable to an AFM (Atomic Force Microscope). The method has the advantages of low cost, high success rate, wide probe tip application range and the like. The preparation method comprises the main steps as follows: firstly, performing electrochemical etching on metal wires, so as to obtain a probe tip with a sharp tail end; secondly, flattening metal wires close to the tail end of the probe tip by adopting silicon wafers or polycrystal sapphire pieces, wherein the flattened part is used as a suspension arm of an AFM probe; thirdly, bending the tail end of the probe tip by a certain angle, wherein the bent part is used as the probe tip of the AFM probe; fourthly, pasting the suspension arm on a specific substrate by using glue. The method can be used for manufacturing a metal probe made of various materials such as gold and silver, the tail end of the metal probe is sharp, the conductivity is excellent, and the preparation method is applicable to the AFM, various electrical measurement technologies (like an electrostatic force microscope) based on the AFM and a tip-enhanced Raman spectroscopy technology based on the AFM, and the like.