The invention provides a transmission
electron microscope sample preparation device and method for high-entropy
alloy nanoparticles, and relates to the field of high-entropy alloys and microscopic characterization thereof. The preparation device comprises a substrate and a round cover with holes, grooves of the substrate are in one-to-one correspondence with the holes in the round cover, and the device is made of a
metal material with high
temperature resistance. According to the preparation method provided by the invention, transmission
electron microscope characterization results of the nanoscale high-entropy
alloy particles and the high-quality high-entropy
alloy nanoparticles can be obtained. The obtained high-entropy alloy particles are uniform in distribution, controllable in size and high in experiment success rate, and a plurality of samples can be prepared at the same time. Through the pulse
laser deposition technology, the high-entropy alloy nano-particles which are evenly distributed and controllable in size can be obtained, the experiment success rate can be increased,
pollution in the experiment process can be avoided, the capacity of preparing a plurality of transmission
electron microscope samples at the same time is achieved, and a high-quality microscopic characterization result can be obtained; and the quality and the preparation efficiency of the high-entropy alloy transmission
electron microscope nanoparticle sample are remarkably improved.