The present application relates to the technical field of pharmaceutical
chemistry, and particularly relates to a new
crystal form of
piroxicam, a preparation method and application thereof, wherein the X-
ray diffraction pattern of the new
crystal form of
piroxicam has characteristic
diffraction peaks at the following 2θ angles: 7.00°, 7.30°, 8.78°, 9.80°, 12.34°, 13.63°, 14.25°, 15.26°, 15.70°, 15.84°, 16.84°, 17.31°, 17.64°, 18.32°, 19.01°, 20.51°, 20.78°, 21.76°, 22.61°, 23.80°, 24.55°, 25.40°, 28.18°, with an error of ±0.1°. The preparation method of the new
crystal form of
piroxicam is simple, and the crystal of the new crystal form of piroxicam has good mechanical elasticity and tabletting performance.