The invention relates to the technical field of
building material test and analysis, and discloses a
cement concrete back scattering
electron image analysis sample preparation method, which comprises: S1, crushing
cement into a sample; s2, stopping hydration and
drying at low temperature: soaking the sample in absolute ethyl
alcohol or isopropanol, and
drying at low temperature; s3, pre-
polishing: pre-
polishing the sample by using raw
abrasive paper; s4, inlaying: inlaying the sample with low-
viscosity epoxy resin in vacuum cold inlaying equipment; s5, rough
grinding is conducted, specifically, the sample is ground through 800 #-2000 #
abrasive paper; s6, secondary low-temperature
drying: wiping the surface of the sample with absolute ethyl
alcohol, and then performing low-temperature drying; s7, fine
grinding: finely
grinding the sample by using 2500 #-4000 #
abrasive paper in sequence; s8,
polishing: polishing the sample by using a 1000 nm polishing solution and a 500 nm polishing solution in sequence; and S9, final cleaning: wiping the surface of the sample with absolute ethyl
alcohol to obtain the sample for analyzing the
backscattered electron image with a flat and
smooth surface. According to the scheme, the
cement samples are processed according to the sequence, so that the flat and smooth samples without scratches and cracks can be obtained, and then the high-quality back scattering
electron image is obtained.